摘要
首次在化学镀样品上成功地实现了扫描开尔文力显微镜的测量,得到了化学镀层表面形貌以及与微观组分分布相关的表面电势差信息。该分析方法没有复杂的样品制备过程,不会破坏样品的原始状态,对于宏观上具有确定组分的微观相分离样品,可以由表面电势差得到不同相的微区分布。比其它的常规分析手段有更高的空间分辨率,能获得更多的材料微区结构、组分与性能间关系的信息。
Samples prepared by electroless cobalt plating were firstly investigated using scanning Kelvin force microscopy (SKFM), and much local information, such as surface morphology and the surface electrical potential difference induced by inhomogeneous composition distribution has been obtained. For a material system with fixed macroscopic composition and microscopic phase separation, the difference phase distribution could be depicted in visual way by SKFM with high spatial resolution. This analytical approach neither requires complex sample preparation process nor changes the sample original state and is able to acquire more local property information on nanometer scale.
出处
《电子显微学报》
CAS
CSCD
2005年第3期192-195,共4页
Journal of Chinese Electron Microscopy Society
基金
湖南省自然科学基金资助项目(No.00JJY1007).
关键词
化学镀
相分离
开尔文力显微镜
表面电势差
electroless plating
phase separation
SKFM
surface potential difference
