摘要
综述了常用的纳米材料表征方法,简单介绍了其原理及应用。并对近期发展起来的 SPM 探针显微技术等高科技纳米表征技术进行了介绍。
In this paper,methods that are often used for characterizing nanoparticles and nanosize materials, their principle and applications are presented.SPM(scanning probe microscopy),new technique developed for this put pose,is also described.
出处
《材料导报》
EI
CAS
CSCD
2001年第4期53-55,共3页
Materials Reports
