摘要
本文讨论由相互独立的成败型元件组成的串并联系统及并串联系统可靠性置信下限的近似解。本文利用系统诸元件的试验数据,在一、二阶矩拟合的原则下将其折合为原系统的伪试验数及伪成功数,然后利用单个成败型元件的可靠性的经典精确置信下限作为原系统可靠性置信下限的近似值。本文推导了伪试验数N及伪成功数S的计算公式,并给出了计算实例。
In this paper we consider the approximate solution of lower confidence limits of reliability for series-parallel and parallel-series systems which are composed of pass-fail components independently. Using the test data of components of the system, the pseudo-test number N and pseudo-success number S of the system are obtained by means of the moment method. Then we regard the exact classical lower confidence limits of simple pass-fail component reliability as the approximate value of lower confidence limits of system reliability. The Computational formula for numbers N and S are presented. At last we make the simulated computation to examine the feasibility of the approximate method.
出处
《高校应用数学学报（A辑）》
CSCD
北大核心
1989年第3期451-457,共7页
Applied Mathematics A Journal of Chinese Universities(Ser.A)
关键词
成败型元件
串并联系统
可靠性
Pass-fail component, Series-parallel system, Parallel-sreies system, Reliability, Confidence limit.
