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考虑检测正确率时成败型元件串联系统可靠性置信下限

The discussion on lower confidence limits for pass-fail components and series system reliability concerning the probability of correction for inspect
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摘要 设有K个成败型元件组成的串联系统,第i个元件的可靠性P_i,P_i未知,设对第i个元件试验了N_i次,每次试验是否成功要通过检测才可确定,设检测的正确率为r_i(r_i已知,r_i>1/2),设第i个元件在N_i次试验中经检测被判为成功的次数是S_i(i=1,2,…,K)。本文讨论由诸元件的被判成功数组(S_1,S_2,…,S_K),利用改进的Wintorbottom排序方法计算系统可靠性的经典精确置信下限的方法以及综合诸元件的试验数据,按一、二阶矩拟合的原则将其折合为系统的成败型数据,计算系统可靠性置信下限的近似方法,文中推导了为试验数及伪成功数的计算公式,并给出了具体的计算例子。 Suppose that a system is composed of pass-fail components A1, A2, …, AK in series, and the reliability of component Ai, Pi, is unknown. Suppose that the number of of tests for component Ai, is Ni, the determination of the success or failure for every test depends on inspect, and probability of thecorrection of inspect is ri (ri>1/2r-is known). On the other hand, we assumethat the number of successes for component Ai according to the inspect in the Ni tests is Si (i = l, 2, 3,…, k). In this article, from number system (S1, S2,…, SK) an exact classical computational method for lower confidence limits of system reliability is presented by the improved Winterbottom's ordering method, and the approximate computational method and formula for lower confidence limits of system reliability are obtained according to the Ist and 2nd order moment fitting principle.
作者 范大茵
出处 《浙江大学学报(自然科学版)》 CSCD 1990年第5期758-767,共10页
关键词 成败型元件 系统可靠性 置信限 Pass-fail component, System reliability, Confidence limit
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参考文献1

  • 1范大茵,浙江大学学报,1986年,20卷,1期,136页

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