摘要
设系统A由K个独立的子系统B_1,B_2,…,B_K并(串)联而成,设第i个子系统B_i又由m_i个相互独立的成败型元件C_(i1),C_(i2),…C_(imi)串(并)联而成,设有多层试验数据: 元件C_(ij)试验N_(ij)次,成功S_(ij)次,失败F_(ij)次(i=1,2,…,K,j=1,2,…,m_i) 子系统B_i有成败型试验数据:试验N_i次,成功S_i次,失败F_i次(i=1,2,…,K) 系统A有成败型试验数据:试验N次,成功S次,失败F次。 本文给出利用此多层成败型试验数据,求系统A的可靠性置信下限的近似解的方法,本文利用一、二阶矩拟合的原则将上述数据折合为原系统A的伪成败型数据:伪试验数N~*,伪成功数S~*,然后从N~*,S~*出发利用单个成败型元件之可靠性的经典精确方法求出原系统A的可靠性置信下限的近似值。本文推导了伪试验数N~*,伪成功数S~*的计算公式,并给出了计算实例。
Let a system (A) be composed of K-independent subsystems B1, B2, B3,..., Bk in parallel (or, in series), and the i-th subsystem be composed of m1-independent pass-fail components Cf1, Cf2,..., Cfm in series (or, in parallel). There exist hierarchical test data as follow: For component Cij, the number of tests, successes, and failures is Nij, Sij andFij respectively (i=l,2,..., K, j = 1,2,..., mi) for subsystem Bi, similarly, Ni, Si, and Fi, respectively (i=l,2,..., K) for system (A), similarly, N, S, F.In this paper, a method for calculating the approximate lower confidence bound for system reliability of (A) is presented. The psuedo pass-fail data(psuedo number of tests N, psuedo number of successes S) are obtained from the hierarchical data by the 1-st and 2-nd order moment fitting method. Then, the approximate bound of (A) is obtained from N and S by the exact classical method for individual pass-fail component. The formulae for N and S with computation example are presented.
出处
《宇航学报》
EI
CAS
CSCD
北大核心
1990年第2期21-28,共8页
Journal of Astronautics
关键词
成败型元件
置信下限
可靠性
Pass-fail component, Series-parallel system, Parallel-series system,Reliability, Confidence limit.
