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聚焦离子束系统中微波离子枪的束光学特性研究 被引量:3

Studies of the Ion Beam Optics of the Microwave Ion Gun Used in the Focused Ion Beam System
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摘要 通过实验和数值模拟研究了聚焦离子束系统中微波离子枪的离子束光学特性,该离子枪由微波等离子体源和Orloff-Swason引出透镜组成。该透镜除了广泛用于场致发射离子枪外,在等离子体源情况下,也能获得很好的离子束光学性能。 Orloff-Swanson extraction lens has been widely used in field emission ion guns, however, no report of its application in ion guns with a plasma source has been published. Recently, the microwave ion gun was developed, which consists of a microwave plasma source and an Orloff-Swanson extraction lens. In this work, the ion beam optics of the microwave ion gun was studied experimentally and analyzed by numerically simulation. Our results showed that when apped to the ion gun with a plasma source, Orloff-Swanson extraction lens can also provide many good ion beam optics properties.
出处 《真空科学与技术》 CSCD 北大核心 1998年第6期415-420,共6页 Vacuum Science and Technology
关键词 聚焦离子束 微波离子枪 离子束光学特性 Focused ion beam,Microwave ion gun, Ion beam optics property
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参考文献8

  • 1毕建华,陆家和.聚焦离子束(FIB)刻蚀在光电子器件方面的应用[J].真空科学与技术,1994,14(4):299-306. 被引量:3
  • 2余增亮.物理,1997,6:334-334.
  • 3施立群 余增亮 等.-[J].原子能科学技术,1997,3:218-222.
  • 4Narum D H,Pease R F W.J Vac Sci Technol,1988;B6(3) :364.
  • 5Burghard R A,Swanson L,Orloff J.J Vac Sci Technol,1987;A5(3):966.
  • 6Meixner C N,Menon M M,Whealton J H.J Appl Phys,1981;52(3):1167.
  • 7Jinchooon K,Whealten J H,Schilling G.J Appl Phys,1978;52(3):517.
  • 8Fu S,Kitaguwa A,Yamada S.Simulation Study on Ion Extracticn from ECR Ion Source.NIRS-M-96,Japan.

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