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内场限环结构 LDMOST 的耐压分析
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作者 唐本奇 高玉民 罗晋生 《西安交通大学学报》 EI CAS CSCD 北大核心 1997年第9期67-71,共5页
文章讨论了内场限环结构LDMOST的参数优化和器件耐压问题,采用直接积分的方法推导出内场限环表面掺杂浓度的精确优化公式.同时,对LDMOST的优化结构开展了耐压分析.与国外同类工作比较,此方法简便直观,计算结果与二维... 文章讨论了内场限环结构LDMOST的参数优化和器件耐压问题,采用直接积分的方法推导出内场限环表面掺杂浓度的精确优化公式.同时,对LDMOST的优化结构开展了耐压分析.与国外同类工作比较,此方法简便直观,计算结果与二维数值模拟结果符合得较好. 展开更多
关键词 ldmost 击穿电压 内场限环结构 耐压分析
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用于智能功率集成电路的PTG-LDMOST
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作者 成建兵 张波 李肇基 《中国集成电路》 2011年第12期51-54,59,共5页
提出一种用于智能功率集成电路的基于绝缘体上硅(SOI)的部分槽栅横向双扩散MOS晶体管(PTG-LDMOST)。PTG-LDMOST由传统的平面沟道变为垂直沟道,提高了器件击穿电压与导通电阻之间的折衷。垂直沟道将开态电流由器件的表面引向体内降低了... 提出一种用于智能功率集成电路的基于绝缘体上硅(SOI)的部分槽栅横向双扩散MOS晶体管(PTG-LDMOST)。PTG-LDMOST由传统的平面沟道变为垂直沟道,提高了器件击穿电压与导通电阻之间的折衷。垂直沟道将开态电流由器件的表面引向体内降低了导通电阻,而且关态的时候耗尽的JFET区参与耐压,提高单位漂移区长度击穿电压。仿真结果表明:对于相同的10微米漂移区长度,新结构的击穿电压从常规结构的111V增大到192V,增长率为73%。 展开更多
关键词 SOI PTG-ldmost 击穿电压 导通电阻
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SJ-LDMOST中的衬底辅助耗尽效应
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作者 成建兵 《电源技术应用》 2012年第8期45-47,共3页
SJ-LDMOST是半导体功率集成技术的核心器件之一,但其击穿电压和比导通电阻之间的优化决定于衬底辅助耗尽效应的消除。这里在分析衬底辅助耗尽效应机理的基础上,将业界消除衬底辅助耗尽效应的主要方法分成两类,并提出通过引入新构造提高... SJ-LDMOST是半导体功率集成技术的核心器件之一,但其击穿电压和比导通电阻之间的优化决定于衬底辅助耗尽效应的消除。这里在分析衬底辅助耗尽效应机理的基础上,将业界消除衬底辅助耗尽效应的主要方法分成两类,并提出通过引入新构造提高漏极纵向击穿电压以彻底消除衬底辅助耗尽效应的途径。 展开更多
关键词 SJ—ldmost 功率集成电路 衬底辅助耗尽效应 击穿电压
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高压RESURFLDMOST的开态电阻与关态电压
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作者 熊平 卢豫曾 《微电子学》 CAS CSCD 1995年第5期23-29,共7页
降低表面电场(RESURF)原理可大大提高LDMOST的器件性能。本文详细研究了用RESURF原理设计的LDMOST的开态电阻与击穿电压的理论分析模型,并根据这一模型对RESURFLDMOST的优化设计作了深入的讨论... 降低表面电场(RESURF)原理可大大提高LDMOST的器件性能。本文详细研究了用RESURF原理设计的LDMOST的开态电阻与击穿电压的理论分析模型,并根据这一模型对RESURFLDMOST的优化设计作了深入的讨论。最后评价了高压RESURFLDMOST在保持器件耐压不变时降低其开态电阻的几种方法。 展开更多
关键词 ldmost 高压器件 功率IC 降低表面电场
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表面电场整形高压RESURF LDMOST
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作者 熊平 卢豫曾 《微电子学》 CAS CSCD 1996年第4期221-225,共5页
提出了采用对LDMOS漂移区表面进行分段离子注入,对表面电场进行整形的一种新结构高压RESURFLDMOST。利用二维数值模拟对这种器件结构的分析表明,这种新结构显著降低了表面电场峰值,降低了采用RESURF技术导致... 提出了采用对LDMOS漂移区表面进行分段离子注入,对表面电场进行整形的一种新结构高压RESURFLDMOST。利用二维数值模拟对这种器件结构的分析表明,这种新结构显著降低了表面电场峰值,降低了采用RESURF技术导致的耐压对工艺参数变化的敏感性,并在耐压不降低的情况下可缩短器件漂移区长度,得到低的比导通电阻Ron·A。 展开更多
关键词 半导体器件 功率器件 ldmost 高压器件 RESURF
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New CMOS compatible super-junction LDMOST with n-type buried layer 被引量:1
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作者 段宝兴 张波 李肇基 《Chinese Physics B》 SCIE EI CAS CSCD 2007年第12期3754-3759,共6页
A new super-junction lateral double diffused MOSFET (LDMOST) structure is designed with n-type charge compensation layer embedded in the p^--substrate near the drain to suppress substrate-assisted depletion effect t... A new super-junction lateral double diffused MOSFET (LDMOST) structure is designed with n-type charge compensation layer embedded in the p^--substrate near the drain to suppress substrate-assisted depletion effect that results from the compensating charges imbalance between the pillars in the n-type buried layer. A high electric field peak is introduced in the surface by the pn junction between the p^--substrate and n-type buried layer, which given rise to a more uniform surface electric field distribution by modulation effect. The effect of reduced bulk field (REBULF) is introduced to improve the vertical breakdown voltage by reducing the high bulk electric field around the drain, The new structure features high breakdown voltage, low on-resistance and charges balance in the drift region due to n-type buried layer. 展开更多
关键词 super-junction ldmost n-type buried layer REBULF breakdown voltage
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INCREASING BREAKDOWN VOLTAGE OF LDMOST USING BURIED LAYER
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作者 Han Lei Ye Xingning Chen Xingbi (Institute of Microelectronics, University of Electrical Science and Technology of China,, Chengdu 610054) 《Journal of Electronics(China)》 2003年第1期29-32,共4页
A new LDMOST structure, named B-LDMOST that has a buried layer under the drain is proposed. The buried layer is not connected to the drift region, so it can optimize the vertical field distribution and increase breakd... A new LDMOST structure, named B-LDMOST that has a buried layer under the drain is proposed. The buried layer is not connected to the drift region, so it can optimize the vertical field distribution and increase breakdown voltage. The analysis and the simulated results show that B-LDMOST can increase breakdown voltage, with almost negligible influence on the other parameters such as on-resistance, switching time, and so on. 展开更多
关键词 B-ldmost Buried layer Breakdown voltage Ou-resistance Switching time
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A Novel Super-junction LDMOST Concept with Split p Columns
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作者 陈林 张波 郑欣 《Journal of Electronic Science and Technology of China》 2006年第2期169-172,共4页
In this paper, we propose a novel low on-resistance Super Junction (S J) Lateral Double-diffusion MOSFET (LDMOST) which has split p column structures with rated voltage of 60-100V. The key feature of this new stru... In this paper, we propose a novel low on-resistance Super Junction (S J) Lateral Double-diffusion MOSFET (LDMOST) which has split p column structures with rated voltage of 60-100V. The key feature of this new structure is that the split p column super junction primarily provides the low on-resistance path and it just locates at the surface of the drift region rather than the entire drift region. The manufacturing process of the device is relatively simple and is compatible with the Bi-CMOS process. Three dimension device simulations indicate that this structure can achieve a low specific on-resistance of 11.5 mΩ·cm^2 at a gate voltage of 5 V compared with 27.7 mΩ·cm^2 for the conventional LDMOST at the breakdown voltage of 80V. 展开更多
关键词 ldmost low on-resistance path Super Junction (SJ) sprit p column
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Electric field optimized LDMOST using multiple decrescent and reverse charge regions
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作者 成建兵 夏晓娟 +3 位作者 蹇彤 郭宇峰 于舒娟 杨浩 《Journal of Semiconductors》 EI CAS CSCD 2014年第7期65-68,共4页
A lateral double-diffused metal-oxide-semiconductor field effect transistor (LDMOST) with multiple n-regions in the p-substrate is investigated in detail. Because of the decrescent n-regions, the electric field dist... A lateral double-diffused metal-oxide-semiconductor field effect transistor (LDMOST) with multiple n-regions in the p-substrate is investigated in detail. Because of the decrescent n-regions, the electric field distribu- tion is higher and more uniform, and the breakdown voltage of the new structure is increased by 95%, in comparison with that of a conventional counterpart without substrate n-regions. Based on the trade-off between the breakdown voltage and the on-resistance, the optimal number of n-regions and the other key parameters are achieved. Furthermore, sensitivity research shows that the breakdown voltage is relatively sensitive to the drift region doping and the n-regions' lengths. 展开更多
关键词 ldmost multiple decrescent and reverse charge regions electric field breakdown voltage ON-RESISTANCE
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An improved SOI trench LDMOST with double vertical high-k insulator pillars
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作者 Huan Li Haimeng Huang Xingbi Chen 《Journal of Semiconductors》 EI CAS CSCD 2018年第9期61-66,共6页
An SOI trench LDMOST(TLDMOST)with ultra-low specific on-resistanceis proposed.It features double vertical high-k insulator pillars(Hk1 and Hk2)in the oxide trench,which are connected to the source electrode and dr... An SOI trench LDMOST(TLDMOST)with ultra-low specific on-resistanceis proposed.It features double vertical high-k insulator pillars(Hk1 and Hk2)in the oxide trench,which are connected to the source electrode and drain electrode,respectively.Firstly,under reverse bias voltage,most electric displacement lines produced by the charges of the depleted drift region in the source side go through the Hk1,and thus the average electric field strength under the source can be enhanced.Secondly,two additional electric field peaks are induced by the Hk_1,which further modulate the electric field in the drift region under the source.Thirdly,most electric displacement lines produced by the charges of the depleted drift region in the drain side enter into the Hk2.This not only introduces one more electric field peak at the corner of the oxide trench around the Hk2,but also forms the enhanced vertical reduced surface field effect,which modulates the electric field in the drift region under the drain.With the effects of the two Hk insulator pillars,the breakdown voltage(BV)and the drift region doping concentration are significantly improved.The simulation results indicate that compared with the oxide trench LDMOST(previous TLDMOST)with the same geometry,the proposed double Hk TLDMOST enhances the BV by 86%and reduces theby 88%. 展开更多
关键词 breakdown voltage HIGH-K specific on-resistance trench ldmost
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An improved analytical model for the electric field distribution in an RF-LDMOST structure
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作者 姜一波 王帅 +2 位作者 李科 陈蕾 杜寰 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第12期57-61,共5页
This paper presents an improved analytical model for an RF-LDMOST structure based on the 2D Poisson equation. The derived model indicates the influence of high doped shallow drift and low doping concentration p epitax... This paper presents an improved analytical model for an RF-LDMOST structure based on the 2D Poisson equation. The derived model indicates the influence of high doped shallow drift and low doping concentration p epitaxial layer on the electric field distribution. In particular, the importance of the thickness of the p epitaxial layer for electric field distributions in RF-LDMOST are shown through MATLAB analytical results based on the model. Then ISE TCAD simulations and experiments are processed and their results are in agreement with the analytical model. This model contributes to the comprehension and optimization design of RF-LDMOST. 展开更多
关键词 RF-ldmost analytical model thickness of p epitaxial layer
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LDMOS晶体管新型器件结构的耐压分析 被引量:3
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作者 唐本奇 罗晋生 +1 位作者 耿斌 李国政 《Journal of Semiconductors》 EI CAS CSCD 北大核心 1999年第9期776-779,共4页
本文提出了一种新型的内置FR/JTE横向DMOS结构,并对其进行了耐压分析,结果表明,该结构具有与RESURF器件相媲美的击穿电压,并且工艺简单,受工艺参数波动的影响较小,相对于内场限环结构,其耐压高且导通电阻低。
关键词 LDMOS晶体管 结构 ldmost 耐压分析
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New Lateral Super Junction MOSFETs with n^+-Floating Layer on High-Resistance Substrate 被引量:2
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作者 段宝兴 张波 李肇基 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第2期166-170,共5页
A new super junction LDMOST structure that suppresses the substrate-assisted depletion effect is designed with an n^+-floating layer embedded in the high-resistance p-type substrate by implanting phosphor or arsenic.... A new super junction LDMOST structure that suppresses the substrate-assisted depletion effect is designed with an n^+-floating layer embedded in the high-resistance p-type substrate by implanting phosphor or arsenic. This effect results from a charge imbalance between the n-type and p-type pillars when the n-type pillars are depleted by p-type substrate. The high electric field around the drain is reduced by the n^+-floating layer due to the REBULF effect,which causes the redistribution of the bulk electric field in the drift region,and thus the substrate supports more biases. The new structure features high breakdown voltage, low on-resistance,and charge balance in the drift region. 展开更多
关键词 super junction ldmost substrate-assisted depletion n^+-floating layer breakdown voltage
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内场限环结构横向MOS晶体管的优化分析
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作者 唐本奇 高玉民 罗晋生 《微电子学》 CAS CSCD 北大核心 1997年第3期155-158,共4页
讨论了内场限环结构对LDMOST耐压的影响,采用直接积分的方法推导出内场限环表面掺杂浓度的精确优化公式。同时,分析了内场限环LDMOST的优化结构的耐压。
关键词 ldmost 高压集成电路 MOS晶体管
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