摘要
本文给出了定时间隔测试时指数分布可靠性增长的Bayes推断方法。在假设研制过程中失效率是非增的约束下,导出了最末阶段失效率的边缘验后分布。
This paper presents a Bayesian inference method of reliability growth for exponential distribution in the case of measuring of fix time interval. Marginal posterior distributions of failure rate in last phase are derived under the assumption that the development process constrains the failure rates to be nonincreasing.
出处
《系统工程与电子技术》
EI
CSCD
1992年第10期72-80,F003,共10页
Systems Engineering and Electronics
关键词
可靠性增长
指数分布
时间间隔
Reliability growth, Bayes estimation, Exponential distribution, Measuring of fix time interval.
