摘要
本文对成败型产品在研制过程中各阶段的可靠性评估问题进行了讨论。在获得了每一阶段的二项试验数据后,运用贝叶斯方法和在可靠度先验分布概率密度函数均匀不变的条件下,给出了第m阶段的可靠度贝叶斯估计值以及置信下限评定方程。本模型与其它增长模型相比,具有标准差小和便于工程应用等特点。
In this paper, the problems of estimating and determining the reliability of the S&F type product at each stage of development testing process are discussed. With binomial test data at each stage obtained the Bayes estimates for reliability at m stage and the confidence lower limit evaluation equation are provided by use the Bayes method and under conditions of uniform prior distribution p.d.f for reliability. Compared with other growth models, the model is characterized by the small standard deviation, convenience of engineering application, etc.
出处
《系统工程与电子技术》
EI
CSCD
1989年第12期71-74,共4页
Systems Engineering and Electronics
关键词
贝叶斯方法
可靠性评价
成败型产品
Bayes method, Reliability evaluation, Reliability prediction model, Confidence limit.
