摘要
基于定数截尾试验数据,本文用经典方法和Bayes方法,考虑了失效时间遵从Poisson过程的可修系统的可靠性增长问题,得到了各研制试验阶段参数的约束极大似然估计和最末阶段参数的经典限和Bayes限.
Based on the failure truncated testing data and by means of classical and Bayesian approaches, this paper discusses reliability growth problems of repairable systems whose failure times are assumed to occur according to a Poisson process. Constrained maximum likelihood estimates (MLEs) of Parameters for each derelopment testing phase and classical and Bayesian limits of parameter for the last development testing phase are obtained.
出处
《系统工程与电子技术》
EI
CSCD
1990年第6期62-67,共6页
Systems Engineering and Electronics
关键词
可靠性
POISSON过程
定数切尾试验
Poisson process, Reliability growth, Failure truncated testing, Constrained MLE.
