摘要
基于定时截尾试验数据,本文用经典方法和Bayes方法,考虑了失效时间遵从Poisson过程的可修系统的可靠性增长问题,得到了各研制试验阶段参数的约束极大似然估计和最末阶段参数的经典限和Bayes限。
Based on the time truncated testing data, reliability growth problems on repairable systems whose failure times are assumed to occur according to a Poisson process; are considered by means of classical and Bayesian approach. Constrained maximum likelihood estimates (MLEs) of parameters for each development testing phase, and classical and Bayesian limits of parameters for the last development testing phase are obtained.
出处
《系统工程与电子技术》
EI
CSCD
1990年第7期72-76,50,共6页
Systems Engineering and Electronics
关键词
可靠性
模型
POISSON过程
Time truncated testing
Constrained maximum likelihood estimate
Goodness-of-fit testing
Trend testing.
