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一种新的Iddq故障定位算法研究 被引量:10

A Novel Method for Fault Location Using Iddq
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摘要 提出了一种新的基于静态电流检测的故障定位算法,该算法依据输入向量序列的响应和电路的结构特征,通过对DUT电路正常情况下的模拟,可直接计算出可能的故障点,并能够完成多故障的定位。实验结果表明该算法能对桥接故障、漏电流故障等进行有效的定位。 A novel algorithm for fault location using Iddq has been presented in this paper. This algorithm is based on the information of the response of input vectors and the structure of the circuit. It could effectively locate the fault by simulating the DUT circuit under normal circumstance. A significant advantage of this method is that it could effectively locate multiple defects in a circuit. Experiment used to illuminate this algorithm is discussed in details.
作者 张兰 徐红兵
出处 《电子科技大学学报》 EI CAS CSCD 北大核心 2004年第2期133-136,共4页 Journal of University of Electronic Science and Technology of China
关键词 静态电流检测 故障定位 多故障检测 桥接故障 Iddq testing fault location multiple faults bridge fault
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  • 1[1]Lee T, Chuang W, Hajj I, et al. Circuit-level dictionaries of CMOS bridging faults[C]. In 12th IEEE VLSI Test Symp,CherryHill, NJ, 1994. 386-389
  • 2[2]Henry C, Janusz R. A method of fault analysis for test generation and fault diagnosis[J]. IEEE TRANSACTION on Computer-Aided Design, 1988, 7(7): 813-833
  • 3[3]Thadikaran P, Chakravarty S. Fast algorithms for computing Iddq tests for combinational circuits[C]. In 9th International Conference on VLSI Design, Bangalore, India, 1996. 103-106
  • 4[4]NIGH P, MALY W. Test generation for current testing[J]. IEEE Design and Test of Computer, 1990, 7(1): 26-38
  • 5[5]Chakravarty S, Zachariah S T. STBM: a fast algorithm to simulate Iddq tests for leakage faults[J]. IEEE TRANSACTIONS ON Computer-aided Design of Integrated and Sustems, 2000, 19(5): 568-576
  • 6[6]Chakravarty S, Liu M. Algorithms for Iddq measurement based diagnosis of bridging faults[J]. Journal of Electronic Testing: Theory and Applications, 1992, 3(4): 377-386
  • 7[7]Anne E G, Maly W. Crrent signtures: application[C]. In International Test Conference, Washington D. C., 1997. 156-164
  • 8[8]Chakravarty S, Liu Minsheng. Algorithms for current monitor based diagnosis of bridging and leakage faults[C]. In 29th ACM/IEEE DESIGN Automation Conference, Dallas Texas, 1992. 353-356
  • 9[9]Aitken R C. A Comparison of defect models for fault location with Iddq measuremetns[C]. In International Test Conference, Baltimore, MD, USA, 1993. 1 051-1 059
  • 10[10]Isern E, Figueras J. Iddq test and diagnosis of CMOS circuits[J]. IEEE Design and Test of Computer, 1995, 12(4):60-67

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