摘要
IDDQ测试方法最适合CMOS电路桥接故障的测试 ,给出CMOS电路IDDQ测试的几个基本概念 ,探讨了桥接故障IDDQ可测性条件 ,从理论上证明了静态CMOS电路线结点桥接故障的IDDQ可测性 .
IDDQ test is suit for the bridging falt test in CMOS circuits, In this paper,Several basic concepts on IDDQ test of CMOS circuits has been given, IDDQ testable condition has been studied, and IDDQ testability of bridging faults of the line-nodes in static COMS circuits been has been proven theoretically.
出处
《怀化师专学报》
2000年第2期37-39,共3页
Journal of Huaihua Teachers College
