摘要
本文综述了材料科学中的高分辨电子显微学发展历史、现状与展望。重点讨论了在高分辨电子显微学中能直接观察物质中原子排列的直接成像法 ,能区分原子种类的选择成像法、能量过滤选择成像法和 Z-衬度像 ,能研究物质结构变化动态过程的分辨时间高分辨电子显微学 。
This article was summarized the development history,current state and future trends of the high resolution electron microscopy in materials science.The development of several important techniques such as direct imaging,selective imaging,energy\|filtered selecting imaging,time\|resolved high resolution electron microscopy,quantitative high resolution electron microscopy,Z\|contrast imaging and telemicroscopy as well as them application to materials science were discussed.
出处
《电子显微学报》
CAS
CSCD
2000年第2期81-103,共23页
Journal of Chinese Electron Microscopy Society
基金
国家自然科学基金重点项目 !(5 98310 2 0 )
国家自然科学基金面上项目 !(5 98710 5 5 )
关键词
原子尺度分辨度
电子显微学
晶界结构
材料科学
atomic resolution
electron microscopy
new phase
defect
structure of grian boundary
characterization
image processing
