摘要
This paper presents an embeddable SOC real-time prediction circuit and method for TDDB.When the SOC under test is fails due to TDDB,the prediction circuit is capable of issuing a warning signal.The prediction circuit,designed by using a standard CMOS process,occupies a small silicon area and does not share any signal with the circuits under test,therefore,the possibility of interference with the surrounding circuits is safely excluded.
This paper presents an embeddable SOC real-time prediction circuit and method for TDDB.When the SOC under test is fails due to TDDB,the prediction circuit is capable of issuing a warning signal.The prediction circuit,designed by using a standard CMOS process,occupies a small silicon area and does not share any signal with the circuits under test,therefore,the possibility of interference with the surrounding circuits is safely excluded.
基金
supported by the National Natural Science Foundation of China(No.60376023)
