摘要
用红外热成像系统直接获得的热像图，是被测器件表面辐射温度的分布，并不是真实温度的分布。现介绍一套电子器件热辐射特性测试分析系统，可以方便地测定物体表面的真实温度分布与发射率分布。通过对一系列电子器件的测试，所获得的结果说明该系统是行之有效的，有着很广泛的用途。
The thermograph obtained by a thermal imaging system is only the distribution of radiant temperature of the surface of measured devices,not the true temperature. In this paper, a set of developed system for determining thermal radiation character of electronic devices is introduced, with which the distribution of true temperature and emissivity can be obtained conveniently.By a series of measured results, the feasibility of this system can be proved.
出处
《红外技术》
EI
CSCD
北大核心
2000年第1期45-48,共4页
Infrared Technology
关键词
红外热成像
电子器件
真实温度
发射率
红外测量
infrared thermograph
electronic device
radiant temperature
true temperature
emissivity
