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引线键合工艺参数的有限元分析 被引量:2

Finite element analysis on ultrasonic wire bonding parameters during bonding process
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摘要 运用Ansys/LS-DYNA模拟引线键合过程,研究分析了键合力、焊盘材料属性、摩擦系数等参数在引线键合过程中对焊球和焊盘应力分布及变形的影响,并将仿真分析结果应用于实验室开发的引线键合机,为键合机的研发和调试提供了理论参考,改善了键合机的键合质量和键合稳定性。实验测量结果表明,有限元分析方法是有效的,结果是合理的,有一定的参考价值。 The analysis of ultrasonic wire bonding was performed by means of finite element method.The effect of the bond force、material properties and the friction coefficient were investigated by deformation analysis of the Au ball by finite element method.The results of the deformation analysis gave valuable advice to the research of wire bonder.The experimental data from the new wire bonder made by our lab show that the result is helpful to improve the quality of bonding,and the finite element method is efficient and feasible.
出处 《机械设计与制造》 北大核心 2011年第2期17-19,共3页 Machinery Design & Manufacture
基金 广东省科技攻关项目(2008A010300009) 广东省中国科学院全面战略合作项目(2009B091300057)
关键词 引线键合 有限元方法 变形分析 Wire bonding Finite element method Deformation analysis
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参考文献6

  • 1何田.引线键合技术的现状和发展趋势[J].电子工业专用设备,2004,33(10):12-14. 被引量:49
  • 2Hsiang-Chen Hsu, W.-Y.C., Shen-Li Fu3. Dynamic Finite Element Analysis on Underlay Microstructure of Cu/low-K Wafer during Bonding Process, 2005.
  • 3Yong Ding, J.-K.K., Pin Tong. Numerical analysis of ultrasonic wire bonding: Effects of bonding parameters on contact pressure and frictional energy. Mechanics of Materials[J],2006,38:12-24.
  • 4谢劲松,钟家骐,杨邦朝,蒋明.CSP键合金丝热应力分析[J].电子产品可靠性与环境试验,2005,23(5):68-71. 被引量:7
  • 5Hiroyuki Saiki,H.N.Deformation characteristics of Au wire bonding. Materials Processing Technology [J ], 2007,24:23-29.
  • 6Chang-Lin Yeh, Y.-S.L., Jenq-Dah Wu. Dynamic Analysis of Wirebonding Process on Cullow-K Wafers. Electronics Packaging Technology Conference [J] ,2003(4):282-286.

二级参考文献9

  • 1Harman, George G., Johnson, Christian E. Wire bonding to advanced copper, low-k integrated circuits, the metal/dielectric stacks, and materials considerations[J]. IEEE Transactions on Components and Packaging Technologies, 2002,25:677-683.
  • 2ITRS. Assembly and Packaging[EB/OL]. Http://PUBLIC.Itrs.net/. ITRS 2003.
  • 3Chylak, Bob; Kumar, Suresh; Perlberg, Gil. Optimizing the wire bonding process for 35-mm ultra-fine-pitch packages[C].Proceedings of SEMICON Singapore 2001 Technical Symposium, 2001, Singapore.
  • 4Kripesh, Vaidyanathan. Wire bonding process impact on low-k dielectric material in damascene copper integrated circuits[C]. Proceedings of the 2002 Electronic Components and Technology Conference, 2002. 873-880.
  • 5杨玉平.CBGA热力偶合失效的实验研究和有限元分析[M].北京:首都师范大学,2002..
  • 6DELOSA D, LISOWSKI J, YUAN T D. Thermal management of multi -chip modules [A] . Micronews, Second Quarter [C] .1996.
  • 7LAU J H, LEE S-W R. Chip scale package.[M] . New Yotk: McGraw-Hill, 1999.
  • 8贾松良 王水弟 蔡坚 译.芯片尺寸封装[M].北京:清华大学出版社,2003..
  • 9倪栋 段进 徐久成.通用有限元分析(ANSYS 7.0)[M].北京:电子工业出版社,2003..

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