摘要
在研究半导体激光器电导数与可靠性的基础上,设计了单管激光器并联实验系统,利用单管激光器并联模拟列阵的方法研究了激光器列阵的可靠性在其电导数曲线和参数上的体现,该实验结果为利用电导数参数作为列阵可靠性判据提供了参考。
Based on the study of the relationship of electrical derivative of semiconductor lasers with their reliability,a test system is designed to measure the electrical derivative of lasers in parallel,from which the characteristics of laser arrays could be simulated to a certain extent.Test result shows that the reliability of laser arrays could be reflected in the electrical derivative parameters.The result can offer references for the criterions of laser arrays＇reliability.
出处
《半导体光电》
CAS
CSCD
北大核心
2010年第4期507-511,共5页
Semiconductor Optoelectronics
基金
集成光电子学国家重点联合实验室开放课题(IOSKL-KF200908)
关键词
半导体激光器
激光器列阵
电导数
可靠性
semiconductor laser
laser array
electrical derivative
reliability
