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纳米结构强化的新型Sn-Ag基无铅复合钎料 被引量:7

Research of New Sn-Ag Based Lead-free Composite Solders Containing Nano-structured Reinforcements
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摘要 通过外加法向Sn-3.5Ag钎料中加入质量分数为1%,2%和3%的纳米级多面齐聚倍半硅氧烷(polyhedral oligomeric silsesquioxanes,POSS)颗粒制备无铅复合钎料。系统研究POSS颗粒的显微组织,钎料的熔化特性、润湿性能和力学性能。结果表明:POSS颗粒的加入并没有改变Sn-Ag基复合钎料熔化温度。复合钎料的铺展面积均有所增加,润湿角有所下降,表现了良好的润湿性。POSS颗粒的加入显著提高钎料钎焊接头的剪切强度。 Composite solders were fabricated by mechanically mixing the Sn-3.5Ag solder paste with nano-seale of 1% (mass fraction), 2% and 3% polyhedral oligomeric silsesquioxanes (POSS) particles. POSS microstrueture, melting characteristic,wetting property and shear strength were investigated. The results showed that the POSS particle didn't change the melting temperature of composite solders. Addition of POSS in the Sn-3. 5Ag solder increased the spreading area and decreased the contact angle of lead-free composite solder. Shear strength of POSS particle reinforced composite solder joints were improved remarkably.
出处 《材料工程》 EI CAS CSCD 北大核心 2009年第8期38-42,48,共6页 Journal of Materials Engineering
基金 北京市科技新星计划B类资助项目(2004B03) 霍英东基金资助项目(104016)
关键词 POSS增强颗粒 熔化特性 润湿性 力学性能 POSS reinforcement particle melting characteristic wettability mechanical property
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参考文献11

  • 1胡志田,徐道荣.无铅软钎料的研究现状与展望[J].电子工艺技术,2005,26(3):125-128. 被引量:11
  • 2GUO F. Composite lead-free electronic solders[J]. J Mater Sci: Mater Electron, 2007,18 (1--3) :129-- 145.
  • 3吴京洧,杨建国,方洪渊.复合钎料的特点及研究现状[J].焊接,2002(12):10-14. 被引量:3
  • 4郭康富,康慧,曲平.无铅钎料开发研究现状[J].电子元件与材料,2006,25(2):1-3. 被引量:6
  • 5SHAWN H PHILLIPS, TIMOTHY S HADDAD, SANDRA J TOMCZAK. Developments in nanoscience, polyhedral oligomeric silsesquioxane (POSS) polymers[J]. Solid State and Material Science, 2004,8(1) :21--29.
  • 6LI Gui-zhi, WANG Li-chang, NI Han li, et al. Polyhedral oligomeric silsesquioxane (POSS) polymers and copolymers: a review [J]. J Inorg Organomet Polym, 2001,11(3) :123-154.
  • 7LEE A, SUBRAMANIAN K N. Development of nano-composite lead free electronic solders[J]. Journal of Electronic Materials, 2005,34(11) :1399-- 1407.
  • 8BOWERS M T, ANDERSON S, BAKER E S, et al. 3-dimensional structure characterization of cationized polyhedral oligomeric silsesquioxanes (POSS) with styryl and phenethyl capping agents[J]. Int J Mass Speetrom, 2003,227(1):205--216.
  • 9ALBERTO FINA, DANIELA TABUANI, ALBERTO FRACHE, et al. Polypropylene-polyhedral oligomeric silsesquioxanes (POSS) nanocomposites[J]. Polymer, 2005,46(19) :7855-7866.
  • 10HUANG B, NING-CHEN LEE. Prospect of lead free alternativesfor reflow soldering[A]. 1999 International Symposium on Microeleetronics[C]. USA:SPIE-Int Soc Opt Eng, 1999. 711-- 721.

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