摘要
阳极溶出伏安法测定镍的椭圆法研究①朱伟杨雨如黄宗卿＊（重庆大学应用化学系重庆４０００４４）电极表面准单分子层上发生的物理或化学变化能使入射的椭圆偏振光的光学参量发生明显的变化，理论分析和实验测定均表明椭圆法可灵敏地提供电极表面０．１ｎｍ厚度层内发生变...
The ellipsometry with a new parameter Vop and anodic stripping voltammetry are used to analyze the nickel ions solutions with different concentration of 10-6～10-9 mol/L. It is shown that the results given by both methods are identical and the sensitivity and accuracy of ellipsometry are higher than anodic stripping voltammety.
出处
《电化学》
CAS
CSCD
1998年第1期106-110,共5页
Journal of Electrochemistry
基金
国家自然科学基金
关键词
椭圆法
镍
测定
阳极溶出伏安法
Ellipsometry, Optical tracking rate, Electrochemical analysis
