摘要
针对全定制设计的芯片提出人工产生测试码的方法。该方法充分利用功能验证程序,从中挑选出对测试有用的信息,经过转换得到满足基本故障覆盖的测试码;再结合芯片自身的结构特点,合理利用芯片内部的调试结构,并按功能部件利用调试链路追加测试码,从而补充完善得到比较完备的测试码。
In this paper, a method of test pattern generation is proposed. This method can use the functional verification programs efficiently, select the useful information for testing from the functional verification procedures, and transform them into test patterns to complete the basic fault coverage. And at the same time, the testing structure is fully made use of to perfect the test patterns and improve the fault coverage.
出处
《航空计算技术》
2008年第6期92-94,98,共4页
Aeronautical Computing Technique
关键词
测试码产生
功能码
调试链路
test pattern generation
functional code
debugging chain
