摘要
目的和方法 :采用膜片钳全细胞记录技术观察新生大鼠海马神经元体外分散培养过程中 ,基本离子通道和膜参数随培养天数延长而变化的规律。结果 :在 7d ,14d和 2 1d时电压依赖性钠电流 (Voltage dependentNa+ cur rent,INa)和延迟整流性钾电流 (DelayedrectifierK+ current,Ik)的幅度无显著性差异。电压依赖性钙电流 (Voltage dependentCa2 + current,ICa)和ICa密度则持续增大 ,进一步研究表明 ,L型钙通道 (L typevoltage dependentCa2 +channel,L VDCC)的增加是其主要原因。NMDA诱发电流随培养时间延长而明显增加。结论 :钙通道和NMDA受体所介导的Ca2 + 内流是神经元易感于衰老和死亡的重要机制之一。
Aim and Methods: Whole-cell recording technique was used to observe the changes of voltage-dependent ion channels and NMDA receptor currents of rat hippocampal neurons during primary culture. Results: There was no significant difference of voltage-dependent Na+ current (I Na) at 7 d, 14 d and 21 d in culture. It's the same for delayed rectifier K+ current (I k). However, voltage-dependent Ca 2+ current (I Ca ) and its density were continuously and markedly increased. Further studies showed that the increase of I Ca was resulted from the increase of L-type voltage-dependent Ca 2+ channels (L-VDCC). NMDA receptor current was also significantly increased with time of culture. Conclusion: Ca 2+ influx through VDCC and NMDA receptor is the fatal factor in the aging and death of hippocampal neurons.
出处
《中国应用生理学杂志》
CAS
CSCD
北大核心
2004年第2期151-155,共5页
Chinese Journal of Applied Physiology
基金
国家重点基础研究发展规划资助项目 (G19990 5 44 0 1)
国家自然科学基金资助项目 ( 3 0 17115 3 )
