摘要
本文研究IC恒定温度应力工作加速寿命试验。在对数正态分布下,参数的估计方法采用极大似然估计(MLE),进行了可靠性特征量估计和假设分布检验。同时,和威布尔分布下的可靠性特征量进行比较,获得了同一失效数据在两种失效分布下的对比结果,为失效分布的选择提供依据。
This eassy deals with the study of operating accelerated life test of constant temperature stress. Under the lognorml distribution: the parameter estimatioo method adopts Maximum Like lihood Estimation(MLE), it is conducted that reliability characteristic estimation and the hypothetic distribution check. At the same time, it contrasts with reliability characteristic value of of weibull distribution, it is obtained that the contrast conclution of identical failure data in the both failure distribution, it bring forward basis for the choice of the failure distfbutiou.
出处
《微电子学与计算机》
CSCD
北大核心
1992年第6期12-15,共4页
Microelectronics & Computer
关键词
失效分布
集成电路
Failure distribution, Estimation, Contrast
