摘要
本文研究了威布尔分布和对数正态分布。通过分布参数估计和候设分布检验,在证实失效数据既符合威布尔分布又符合对数正态分布的基础上,提出了以检验统计量D。(理论分布函数和实际分布函数之差的最大绝对值)的大小作为失效分布选择的依据,从而认为对数正态分布是IC的最佳失效分布。
The essay deals with the study of weibull and lognormal distribution Accordiong to the parameter estimation and the hypothetic check of distribution, and on the base of the proving of the failure data which both fit the weibull and lognormal distribution, it bring forward the checking Statistical value Dn, The biggest abso-Int value of the difference of the theory distribution and practical distribution. and it is the basis for the choice of the failure disiribution. So that it is considered that the Lognormal distribution is the best failure destribution to the integrated crrcuit.
出处
《微电子学与计算机》
CSCD
北大核心
1989年第8期27-29,共3页
Microelectronics & Computer
