摘要
提出原子力显微镜 (AFM)的新设计 ,讨论卧式 AFM的工作原理及其性能特点 ,简要介绍 AFM的控制电路系统及其图像扫描和图像处理软件系统 ,给出 AFM扫描获得的部分样品的图像结果。
A new design of horizontal atomic force microscope(AFM)was developed.The principle and characteristics of the new horizontal AFM were discussed.The control circuits and software systems for image scanning and processing were introduced.Some experimental results of image acquisition by using the horizontal AFM were also presented.
出处
《光学仪器》
2001年第2期14-17,共4页
Optical Instruments
