摘要
传统的基于Verster原理检测芯片内部温度的电路有着误差较大、结构相对复杂的缺点。在传统电路基础上提出了一种采用电流镜法的实现电路,此种电路能够避免由于温度对器件的影响而造成的误差,且电路结构简单。对此电路及性能指标进行了模拟仿真,结果表明了此电路灵敏度高、误差小。
The traditional circuit for temperature measurement inside the chip based on Method by Verster has two disadvantages: The error of the circuit is large and the structure is complex. The improved circuit based on the analysis of the traditional circuit had been realized. The circuit can effectively decrease the error of the temperature effecting on the implement and its structure is simple. The result of the simulation demonstrates the circuit has higher sensitivity and less error.
出处
《电子器件》
CAS
2003年第3期325-328,268,共5页
Chinese Journal of Electron Devices
