摘要
测量了采用溶胶 -凝胶法制备的 Ce O2 - Y2 O3电解质薄膜的阻抗谱 ,结果表明阻抗谱与薄膜的热处理温度有关。根据阻抗谱的变化及薄膜的 XRD图 ,提出了薄膜内部的模拟等效电路 ,并由此对不同热处理温度下薄膜的阻抗谱进行了分析。
The complex impedance of CeO 2 Y 2O 3 thin film by using the sol gol dip coating method was measured. The results showed that the complex impedance spectroscopy was relevant to different heated temperatures. According to the change of complex impedance spectroscopy and XRD of ceria thin film, the equivalent circuit models of the thin film was recommended, and the complex impedance spectroscopy of the thin film was analyzed at different heated temperatures.
出处
《武汉理工大学学报》
CAS
CSCD
2003年第6期19-21,共3页
Journal of Wuhan University of Technology
基金
湖北省教育厅重点科研项目资助 (2 0 0 3A0 0 3)
关键词
纳米CeO2薄膜
电解质
阻抗谱
等效电路
nano ntructured ceria thin film
electrolyte
complex impedance spectroscopy
the equivalent circuit