摘要
介绍了国外半导体器件成品率与可靠性之间关系的研究结果,提出了元器件成品率的高低,是产品质量与可靠性高低的“预示”这一观点。同时还对成品率损失的原因、影响产品质量和可靠性的原因进行了分析,为内建可靠性、提高产品的成品率、质量和可靠性提供参考。
This article introduces the result of relationship between the rates of finished semicon ductor device and reliability and that the rates of finished semiconductor device are the indicator of product quality and reliability. At the same time, the factors that lead to losing of the rates of finished products. product quality and reliability are analyzed to help to strengthen reliability and improve the rates of finished product and quality.
出处
《电子产品可靠性与环境试验》
2002年第3期58-62,共5页
Electronic Product Reliability and Environmental Testing
关键词
半导体器件
工艺控制
成品率
质量
可靠性
parts of an electron apparatus
techniques control
the rates of finished product
quality
reliability
