摘要
使用傅里叶变换光谱仪（FTIR）测试甚长波宽波段（6．4～15μm）红外探测器响应光谱的过程中，发现短波方向响应光谱异常。通过分步测试分析发现：探测器和放大器工作在非线性工作区导致某些情况下仪器信号发生饱和，引起了短波方向响应光谱畸变的现象。对FTIR测量甚长波宽波段（6．4～15μm）红外探测器响应光谱的畸变现象进行了分析，认为探测器的响应时间是影响其响应光谱的重要因素，并通过试验确定了测试系统对不同探测器所设置的测试参数，消除了响应光谱畸变的现象，并提高了测试准确度。
In measuring response spectrum of long wavelength broad-band （6. 4--15 μm） infrared detectors by using Fourier Transform Spectrometer（FTIR）, the response spectral distortion at short wave is found. Through the test step by step. It is discovered that the spectrum signal will saturate if the detectors and amplifiers work in nomlinearity workspace, resulting in the phenomenon of spectral distortion at short-wave. In this article, the signal saturation is investigated, response time is an important factor for response spectrum of different detectors. FTIR measurement for different detectors test paramelers are studied. The phenomenon of response spectral distortion is eliminated, and the measurement accuracy is improved by u sing the appropriate parameters.
出处
《光学与光电技术》
2014年第2期79-82,共4页
Optics & Optoelectronic Technology
关键词
傅里叶变换光谱仪
甚长波宽波段红外探测器
探测器饱和
响应光谱
响应时间
Fourier transform spectrometer
long wavelength broad-band （6.4--15μm） infrared detectors
detector satura tion
response spectrum
response time
