摘要
用 Raman散射和 XPS技术分析了能量为几百 ke V到几百 Me V的多种离子在 C60 薄膜中引起的辐照效应 .分析结果表明 ,在低能重离子辐照的 C60 薄膜中 ,其晶态向非晶态的转变过程是由核碰撞主导的 .在快离子 (1 2 0 ke V的 H离子和 1 71 .2 Me V的 S离子 )辐照的情况下 ,电子能损起主导作用 .发现在 H离子辐照过程中 ,电子能损有明显的退火效应 ,致使 C60 由晶态向非晶态转变的过程中 ,经历了一个石墨化的中间过程 ;而在 S离子辐照的情况下 ,电子能损的破坏作用超过了退火效应 ,因此 ,在 C60 由晶态向非晶态转变的过程中 。
Irradiation effecs (mainly including transformation from crystalline into amorphous state) of C 60 films induced by 120 keV H, He, N, Ar, Fe and Mo ions, 240 keV and 360 keV Ar ions, and 171.2 MeV, 125.3 MeV and 75.8 MeV S ions were analysed by means of Raman scattering and XPS technique. The analysis results indicate that amorphization process in the cases of N, Ar, Fe and Mo ions irradiation is dominated by nuclear collision, but in the case of H ion irradiation, the process is dominated by electron energy transfer. The annealing effect of electron energy loss which induced the intermediate graphitization process before amorphization in lower irradiation dose ranging from 2×10 14 to 5×10 16 ions/cm 2 was found in the case of H ion irradiation for the first time. In the case of swift S ion irradiation, the destruction action of the strong electronic excitation exceeds the anneaning effect, and therefore there is no intermediate graphitization process.
出处
《原子核物理评论》
CAS
CSCD
2000年第3期134-139,共6页
Nuclear Physics Review
基金
国家自然科学基金资助项目!(19675054)
中国科学院基础性研究重点项目!(KJ952-S1-423)
关键词
辐照效应
荷能离子
退火效应
碳60薄膜
irradiation effect
C_(60) film
low energy ion
annealing effect
