摘要
本文用偏最小二乘法(PLS)对重叠严重的硫的价态(-2,0,+4,+6)双晶X射线荧光光谱进行了处理,同时计算出各种价态硫浓度。本文还将PLS与主成分回归进行了比较,表明PLS是一种较好的多元校正方法。
The Sk_α X-ray fluorescence spectra of sulfur compounts with four different valences (-2, 0, +4, +6) which overlap seriously over the who wavelength region are measured by a double-crystal X-ray fluorescence spectrometry. The overlapped spectra are handled by partial least-squares method, and the coneerntrations of sulfur with different valences are given simultaneously. The results are compared with those calculated by principle component regression (PCR), and they prove that the PLS is a powerful multivariate calibraion method.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1991年第4期55-57,70,共4页
Spectroscopy and Spectral Analysis
