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数字电路测试生成的可满足性方法研究 被引量:2

Research on Testing Pattern Generation for Digital Circuits using Satisfiability Approach
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摘要 本文介绍了可满足性的测试向量生成 (SAT- ATPG)算法。通过控制输入跟踪算法 (CITA)嵌入 SAT- ATPG中 ,减少了 CNF的构成时间和搜索空间 ,加速测试生成 ,减轻故障压缩工作量 。 In the paper, we describe a efficient algorithm for ATPG—SAT ATPG algorithm based on Satisfiabi lity (SAT). CITA(Controlling Input Values Tracing Algorithm) proposed has been incorporated into SAT ATPG. CPU time of generating CNF and the traversing space are reduced. This algorithm gain compact test set with low price.
出处 《仪器仪表学报》 EI CAS CSCD 北大核心 2001年第1期28-31,共4页 Chinese Journal of Scientific Instrument
关键词 控制输入跟踪算法 测试生成 数字电路 SAT-ATPG算法 可满足性 Controlling input values tracing algorithm Test generation Digital circuits
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  • 1侯艳丽,赵春晖.基于粒子群算法的数字电路测试生成[J].应用科技,2006,33(6):14-17. 被引量:2
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