摘要
基于实验室X射线衍射仪,利用其运行稳定性和高精度角度控制能力,通过设计、制作晶体样品架,对X光平面晶体的本征参数晶格常数和积分衍射效率进行了实验标定,并给出其不确定度。该方法快速、高效、方便、灵活,实现了X光晶体的实验室标定,为ICF物理实验线谱诊断设备晶体谱仪的定量化测量提供了数据支撑。
Using X- ray diffractometer （XRD） , the calibration method of essential parameters such as crystal lattice spacing and integral diffractive coefficient has been introduced. It is based on stability and 0 -20 precision control of XRD and special design of crystal sample frame. The experiments are done in common laboratory and the uncertain ranges of data are discussed. This method is efficient and convenient by XRD in common laboratory and it can provide effective data support on quantificational diagnosis of crystal spectrometer in ICF research.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2013年第3期316-320,共5页
Nuclear Electronics & Detection Technology
关键词
X射线衍射仪
X光晶体
本征参数
标定方法
X - ray diffractometer
X - ray crystal
essential parameter
calibration method
