期刊文献+

基底温度对脉冲激光沉积WS_x薄膜组织结构和摩擦学性能的影响 被引量:4

Effects of Deposition Temperature on Microstructure and Tribological Properties of Pulsed Laser Deposited WS_x Films
原文传递
导出
摘要 采用脉冲激光沉积法(PLD)在不同温度单晶硅基底上制备了WSx固体润滑薄膜.利用扫描电子显微镜(SEM)、X射线能谱仪(EDS)、X射线衍射仪(XRD)对薄膜的成分、形貌和微观结构进行了分析,采用球-盘式磨损试验机测试了薄膜在大气环境下(相对湿度50%~60%)的摩擦学特性.结果表明:室温下所获得的薄膜为微晶结构;在RT~300℃范围内,随着温度的升高,薄膜表面趋于光滑、致密,且形成晶态WSx的趋势逐渐增大,薄膜与基底间的结合力增大,但薄膜中S和W的含量之比(S/W比)从1.84逐步下降到1.49.薄膜的摩擦系数在RT~200℃范围内与其S/W比呈反比关系,在300℃条件下,薄膜中形成了大量的WS2晶体,摩擦系数最低且耐磨性能也最好. WSx solid lubrication films were deposited on monocrystalline silicon substrates at various temperatures by pulsed laser deposition. The composition, morphology and microstructure of the films were characterized by scanning electron microscopy, energy dispersive X - ray spectroscopy and X - ray diffractometer respectively. The tribological behavior of the films were investigated using a ball - on - disk tribometer in atmosphere ( relative hmnidity 50% to 60% ). The results show that the film deposited under room temperature was of crystallite structure. As rising the substrate temperature from room temperature to 300 ℃, the surface of the film became smoother and more compact, and the bonding strength between film and substrate and the crystallinity degree of WSx phase increased. However, the atom fraction ratio of sulfur to tungsten of the film ( S/W ratio) decreased from 1.84 to 1.49. The friction coefficient was inversely correlated with the S/W ratio in the substrate temperature range of RT - 200 ℃. A great amount of crystalline WS2 was formed within the film at a substrate temperature of 300 ℃, and the film exhibited the lowest friction coefficient and excellent wear resistance.
出处 《摩擦学学报》 EI CAS CSCD 北大核心 2012年第6期612-618,共7页 Tribology
基金 浙江省自然科学基金项目(Y4110645)资助~~
关键词 薄膜 WS2 脉冲激光沉积 基底温度 固体润滑 thin film, WS2 , pulsed laser deposition, substrate temperature, solid lubrication
  • 相关文献

参考文献21

  • 1Hilton M R, Fleischauer P D. Applications of solid lubricant films in spacecraft [ J ]. Surface and Coatings Technology, 1992, 54 -55(1) :435 -441.
  • 2王均安,于德洋,欧阳锦林.二硫化钼溅射膜在潮湿空气中贮存后润滑性能的退化与失效机理[J].摩擦学学报,1994,14(1):25-32. 被引量:52
  • 3Rai A K,Bhattaeharya RS,Zabinski J S,et al. A comparison of the wear life of co - deposited and ion irradiated WS2 coatings [J].Surface and Coatings Technology,1997,92( 1 -2) :120-128.
  • 4Lauwerens W, Wang J H, Navratil J. et al. Humidity resistant MoSx films prepared by pulsed magnetron sputtering [ J ]. Surface and Coatings Technology ,2000,131 ( 1 - 3 ) :216 - 221.
  • 5Scharf T W, Prasad S V, Dugger M T,et al. Growth, structure and tribological behavior of atomic layer - deposited tungsten disulphide solid lubricant coatings with applications to MEMS [J]. Acta materialia,2006,54( 18 ) :4 731 -4 743.
  • 6Carmah C J, Parkin L P, Peters E S. Atmospheric pressure chemical vapor deposition of WS2 thin fihns on glass [ J ]. Polyhedron ,2003,22 ( 11 ) : 1 499 - 1 505.
  • 7Chung J W, Dai Z R, Chuchi F S. WS2 thin films by metal organic chemical vapor deposition [ J ]. Journal of Crystal Growth, 1998,186(1 -2) :137 - 150.
  • 8Sadale S B, Patil P S. Synthesis of type - I textured tungsten disulfide thin films on quartz substrate [ J ]. Journal of Crystal Growth ,2006,286(2 ) :481 -486.
  • 9赖德明,涂江平,张升才,王倩,彭世敏,何丹农.溅射沉积WS_2/Ag纳米复合薄膜在不同环境中的摩擦磨损性能研究[J].摩擦学学报,2006,26(6):515-519. 被引量:20
  • 10Martin- Liras I, Vinatier P, Lecasseur A, et al. Characterization of rf sputtered tungsten disulfide and oxysulfide thin films[J]. Thin Solid Films,2002,416 (1) :! -9.

二级参考文献71

共引文献101

同被引文献30

引证文献4

二级引证文献12

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部