摘要
文章采用电感耦合等离子体质谱仪(ICP-MS)测定了甲基氯硅烷生产使用的有机硅床内触体中的铅(Pb)含量,研究了触体中存在的主要元素铜(Cu)对Pb的基体干扰。探讨了采取不同试样预处理方法对测定结果的影响。经测试对比,先加王水热熔,后用硫酸洗脱的方式结果较为准确,测得有机硅合成床内触体中Pb含量1.516 ppm,且RSD值仅为1.03%。
The Lead content in the production of methyl chorosilanes contact mass was determined by ICP-MS,and the impact of the elements interfering elements copper was studied.Considered the effection of different sample preparation methods on the Measured results.after contradistinction,Taking the methode of whicht,first using Aqua Regia heated and dissolved the solid,then using concentrated sulfuric acid eluted could receive an exceptional result,Lead Content from Silicon Contact Mass Determined towards 1.156ppm,with RSD only 1.03 %.
出处
《广东化工》
CAS
2012年第13期130-132,共3页
Guangdong Chemical Industry
关键词
ICP-MS
有机硅
触体
铅
测定
ICP-MS
silicone
contact mass
lead
determination
