摘要
采用电感耦合等离子体发射光谱测定了甲基氯硅烷生产使用的触体中铅(Pb)的含量,研究了触体中存在的主要元素铜对Pb测定的光谱干扰。选择灵敏度较高的220.353 nm为分析谱线,采用与试样Cu含量基本匹配的测试方法。被测元素样品加标回收率为103%,RSD(n=10)小于3%。
The lead content in the production of methyl chlorosilanes contact mass was determined by ICP-AES,and the impact of the elements interfering elements copper was studied.Choosing 220.353 nm as the spectral line,the analysis method was proposed matching the content of copper.The spiked recovery of the measured elements was 103% with RSD（n=10）3%.
出处
《有机硅材料》
CAS
2012年第2期109-111,共3页
Silicone Material
