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VO_2薄膜研究进展与发展趋势 被引量:4

Research progress and development tendency of VO_2 thin film
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摘要 VO2是一种新型材料,在68℃左右可发生低温半导体与高温金属相之间的可逆相变。综述了VO2薄膜的基本性能,介绍几种常用的VO2薄膜制备方法,对VO2薄膜的应用以及VO2薄膜相变温度的控制方面的研究进展进行探讨;对VO2薄膜的不同应用方向、未来发展趋势及研究重点进行展望。 VO2 is a new functional material, and it has a reversible transition between low-temperature semiconductor phase and high-temperature metal phase at about 68 ℃. This paper briefly reviews the basic properties, and introduces several common preparation methods of VO/thin films. The research progress of the application and the control of phase transition temperature for VO: thin films are discussed. Furthermore, different application direction, the development tendency and research emphases of VO2 thin film are prospected.
作者 张鹏 路远
出处 《兵器材料科学与工程》 CAS CSCD 北大核心 2012年第4期109-112,共4页 Ordnance Material Science and Engineering
关键词 VO2薄膜 制备方法 相变温度 VO2 thin film preparation methods phase transition temperature
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