摘要
用Ｘ射线衍射和Ｘ射线光电子能谱技术，对分舟热蒸发法研制的掺铒（Ｅｒ）硫化锌直流电致发光薄膜及硫化锌粉料进行剖析，获得薄膜表面及粉料的构态信息，讨论了影响微晶薄膜质量的主要因素。
The zinc sulfide DCEL thin films doped with erbium, prepared by thermal evaporation with two boats, are analysed with XRD and XPS technologies. The structure state information of ZnS powder and thin film surface is obtained. The factors influencing on the quality of microcrystalline thin films are discussed as well.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
1999年第1期97-100,共4页
Research & Progress of SSE
基金
福建省自然科学基金
关键词
硫化锌
直流电致发光
微晶薄膜
稀土掺杂
Zinc Sulfide(ZnS) Direct Current Electroluminescence(DCEL) Microcrystalline Thin Film Rare Earth Element Doped
