摘要
对射频磁控溅射法制备的掺铒硫化锌薄膜，运用X射线衍射和X射线光电子能谱技术，获得微晶薄膜的微结构和表面构态信息，揭示了电致发光薄膜的表面构态对激发态的影响。
The zinc sulfide thin film devices doped with erbium prepared byRFMS are studied. The information of microstructure and surface structure statesof the crystallite film is obtained by XRD and XPS methods. The effects of the surface structure states of the elcctroluminescent thin film on exciting states are discussed.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
1998年第3期319-322,共4页
Research & Progress of SSE
基金
国家自然科学基金
福建省自然科学基金
关键词
电致发光
微晶薄膜
激发态
硫化锌
Electroluminescence Crystallite Film Exciting State
