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三端稳压器的总剂量效应 被引量:3

Total dose effect of three-terminal regulators
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摘要 本文对电子系统中通用的集成三端稳压器在不同负载条件下做60Coγ电离辐照试验来研究它的性能变化和抗总剂量特征。试验结果发现,稳压器的输出电压、最大负载电流等都为敏感参数,变化较明显;但不同器件间的抗总剂量水平不同。因此,设计工作在辐射环境中的电路时,尽量选用固定输出的三端稳压器,且最大负载电流保留一定设计余量,在辐照后仍能满足电路系统的需求。 Three-terminal regulators used in electronic system were irradiated by 60Coγ-rays to investigate their total-dose effects. The results show that the output voltage and the maximum load current of the regulators were quite sensitive to the total dose. The output voltage of adjustable regulators changed more sharply than that of fixed. For circuits operating under the radiation environment, the fixed voltage regulator is betterthan adjustable regulators. Meanwhile, the maximum load current should be considered to satisfy the need of the circuits system with the reduction after irradiated.
出处 《核技术》 CAS CSCD 北大核心 2010年第6期465-468,共4页 Nuclear Techniques
关键词 三端稳压器 电离辐射 总剂量效应 Three-terminal regulators, Ionizing radiation, Total dose effect
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  • 1曾天亮,陈平,江志庚,李志彭.BPSG膜的沉积、性质及其应用[J].微电子学与计算机,1989,6(2):12-15. 被引量:3
  • 2张国强,严荣良,余学锋,高剑侠,罗来会,任迪远,赵元富,胡浴红,王英明.掺HCl PMOSFET的电离辐射总剂量效应[J].核技术,1995,18(2):117-120. 被引量:3
  • 3李瑞珉,杜磊,庄奕琪,包军林.MOSFET辐照诱生界面陷阱形成过程的1/f噪声研究[J].物理学报,2007,56(6):3400-3406. 被引量:14
  • 4童诗白,华成英.模拟电子技术基础[M].北京:高等教育出版社,2003.
  • 5ADELL P C,SCHRIMPF R D,HOLMAN W T,et al.Total dose effects in a linear voltage regulator[J].IEEE Trans Nucl Sci,2004,51(6):3816-3821.
  • 6BEACOUR J T,CARRIERE T,GACH A,et al.Total dose effects on negative voltage regulator[J].IEEE Trans Nucl Sci,1994,41(6):2420-2426.
  • 7RAMACHANDRAN V,NARASIMHAM B,FLEET-WOOD D M,et al.Modeling total-dose effects for low-dropout voltage regulator[J].IEEE Trans Nucl Sci,2006,53(6):3223-3231.
  • 8BARNABY H,TAUSCH H J,TURFLER R,et al.Analysis of bipolar linear circuit response mechanisms for high and low dose rate total dose irradiations[J].IEEE Trans Nucl Sci,1996,43(6):3040-3048.
  • 9ON Semiconductor Inc.Linear & switching voltage regulator handbook 4th ed.[EB/OL].http:∥www.onsemi.com,2002.
  • 10ADELL P C, SCHRIMPF R D, HOLMAN W T, et al. Total dose effects in a linear voltage regulator [J]. IEEE Trans Nuel Sci, 2004, 51(6): 3816-3821.

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