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双极型器件的总剂量辐射效应与损伤机理 被引量:2

Total Dose Ionizing Radiation Effect and Degradation Mechanism of Bipolar Devices
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摘要 随着空间技术的发展,双极型器件和线性电路被广泛应用于辐射环境。从钝化层辐射损伤机理出发,介绍辐射诱生钝化层固定电荷与界面态的产生机理与计算模型,结合基极电流模型探讨双极型器件与电路的总剂量辐射效应,并针对双极型器件的低剂量率辐射损伤机理与模型展开讨论。 With the development of space technology , bipolar devices and linear circuits are widely used in the radiation environment .Based on the degradation mechanism of passivation layers , this paper reviews the gener-ation mechanism and physical model of radiation -induced fixed charge and interface state in the passivation layer.Incorporating the base current model , total dose radiation effects of bipolar devices and circuits are dis-cussed .In the last section , the enhanced low dose rate effects of bipolar devices are reviewed and analysis .
出处 《核电子学与探测技术》 CAS CSCD 北大核心 2013年第12期1557-1562,共6页 Nuclear Electronics & Detection Technology
基金 国家自然科学基金(61204112) 中国博士后科学基金(2012M521628)
关键词 双极型器件 总剂量辐射效应 低剂量率 bipolar device total dose effect low dose rate
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