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软X光多层镜反射率的标定与修正

Calibration and Amendment of Soft X-Ray Multilayer Mirror Reflectivity
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摘要 在北京同步辐射装置上,利用3W1B束线得到了21°-B4C/Si,21°-B4C/Mo,10°-Cr/Ti,15°-B4C/W,10°-B4C/W以及6.86°-B4C/W等多层镜在50~1500eV能段上的反射率标定曲线.分析了标定结果的不确定度,计算得到多层镜的积分衍射效率,并修正了标定结果. Beijing synchrotron radiation facility (BSRF)-3W1B beam line was used to perform experiments for ML mirrors reflectivity calibration. The reflectivity calibration curves of 21°-B4C/Si, 21°-B4C /Mo, 10°-- Cr/Ti, 15°- B4 C/W, 10°- B4C/W, 6.86°- B4 C/W and 15°- B4 C/W multilayer mirrors were given in the region of 50 -1500 eV. The values of experiment and calculation were compared and analyzed. Then the uncertainty and integral reflection coefficients were given. Then the amendment of calibration data was completed. As a database and theoretical base, these results guarantee ML to be applied well in the ICF experiments.
出处 《光子学报》 EI CAS CSCD 北大核心 2009年第4期827-831,共5页 Acta Photonica Sinica
关键词 多层镜 反射率 标定 同步辐射 修正 Muhilayer mirror Reflectivity Calibration Synchrotron radiation Amendment
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