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SnAgCu体钎料及BGA焊球焊点纳米级力学性能 被引量:2

Nano-mechanical properties of SnAgCu bulk solder and BGA solder ball and solder joint
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摘要 为了研究低银Sn-0.3Ag-0.7Cu无铅体钎料、BGA焊料小球和BGA焊点的力学行为,基于物理反分析的方法采用纳米压痕仪对其进行实验。从压痕载荷–深度曲线提取出弹性模量、硬度和蠕变速率敏感指数。结果表明:体钎料的杨氏模量和蠕变速率敏感指数大约是BGA焊料小球和BGA焊点的2.5倍,验证了尺寸效应理论。采用纳米压痕仪测出的体钎料维氏硬度(15.101HV)小于显微硬度计的测量结果(20.660HV)。 Nanoindentation apparatus with physics anti analysis method were performed on the Sn-0.3Ag-0.7Cu bulk solder, BGA solder ball and BGA solder joint in order to measure their mechanical behavior, The Young's modulus, the hardness and the creep rate sensitivity exponent of them were obtained from indentation load-depth curves. The result indicates that the Young's modulus and the creep rate sensitivity exponent of bulk solder is 2.5 times that of the BGA solder ball and BGA solder joint approximately. The Vickers hardness value (15.101 HV) measured by the nanoindentation apparatus is smaller than that of the test value (20.660 HV) measured by the microhardness meter.
出处 《电子元件与材料》 CAS CSCD 北大核心 2008年第9期69-72,共4页 Electronic Components And Materials
基金 国家自然科学基金资助项目(No.50575060)
关键词 电子技术 电子封装技术 纳米压痕 Sn-0.3Ag-0.7Cu无铅钎料 electron technology electronic packaging technology nanoindentation Sn-0.3Ag-0.7Cu lead-free solder
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  • 1张建民,徐可为.纳米压痕法测量Cu的室温蠕变速率敏感指数[J].物理学报,2004,53(8):2439-2443. 被引量:12
  • 2杜长华,陈方,杜云飞.Sn-Cu、Sn-Ag-Cu系无铅钎料的钎焊特性研究[J].电子元件与材料,2004,23(11):34-36. 被引量:35
  • 3薛松柏,陈燕,吕晓春.Sn-Ag-Cu-Ce无铅钎料合金体系的热力学计算及预测[J].焊接学报,2005,26(5):20-22. 被引量:24
  • 4[1]MAHMUDI R,ROUMINA R,RAEISINIA B.Investigation of stress exponent in the power-lawcreep of Pb-Sb alloys[J].Materials Science and Engineering A,2004,382:15-22.
  • 5[2]NGAN A H W,WANG H T,TANG B,et al.Correcting power-law viscoelastic effects in elastic modulus measurement using depth-sensing indentation[J].International Journal of Solids and Structures,2005,42:1831-1846.
  • 6[3]MA X,YOSHIDA F.Rate-dependent indentation hardness of a power-law creep solder alloy[J].Appl Phys Lett,2003,82:188-190.
  • 7[4]GUIN J P,ROUXEL T,KERYVIN V,et al.Indentation creep of Ge-Se chalcogenide glasses below Tg:Elastic recovery and non-Newtonian flow[J].Journal of Non-Crystalline Solids,2002,298:260-269.
  • 8[5]ZHANG K,WEERTMAN J R.The influence of time,temperature,and grain size on indentation creep in high-purity nanocrystalline and ultrafine grain copper[J].Appl Phys Lett,2004,85:5197-5199.
  • 9[6]YANG S,ZHANG Y W,ZENG K Y.Analysis of nanoindentation creep for polymeric materials[J].J Appl Phys,2004,95:3654-3667.
  • 10[7]LUCAS B N,OLIVER W C.Indentation power-law creep of high-purity indium[J].Metallurgical and Materials Transactions,1999,30:601-610.

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同被引文献33

  • 1王凤江,钱乙余,马鑫.纳米压痕法测量Sn-Ag-Cu无铅钎料BGA焊点的力学性能参数[J].金属学报,2005,41(7):775-779. 被引量:24
  • 2李晓延,严永长.电子封装焊点可靠性及寿命预测方法[J].机械强度,2005,27(4):470-479. 被引量:47
  • 3LIDDLE D E. The Wider Impact of Moore' s Law[ J]. Solid-State Cireuits Newsletter, 2006, 8:28-30.
  • 4DAVID C. Brock. Understanding Moore' s Law: Four Decades of Innovation[ M ]. Philadelphia, Chemical Heritage Press, 2006 : 98 - 100.
  • 5SEAN M. Chinenl, MATI'HEW T, Siniawski. Overview of Fa- tigue Failure of Pb-Free Solder Joints in CSP/BGA/Flip-Chip Ap- plications[J]. Journal of Microelectronics and Electronic Packa- ging, 2009, 6 : 1 - 5.
  • 6IKUO Shohji, HIDEO Mori, YASUMITSU Orii. Solder Joint Reli- ability Evaluation of Chip Scale Package Using a Modified Coffin- Manson Equation [ J ]. Microelectronics Reliability, 2004, 44 (2) : 269 - 274.
  • 7GEORGE M. PHARR, Erik G. Herbert, GAO Yanfei. The In- dentation Size Effect : A Critical Examination of Experimental Ob- servations and Mechanistic Interpretations [ J ]. Annual Review of Materials Research, 2010, 40 (8) : 271 -292.
  • 8GERBERICH W W, TYMIAK N I, GRUNLAN J C. Interpreta- tions of Indentation Size Effects [ J ]. Journal of Applied Mechan- ics, 2002, 69:433-440.
  • 9VILLAIN J, BRUELLER 0 S, QASIM T. Creep Behavior of Lead Free and Lead containing Solder Materials at High Homologous Temperatures with Regard to Small Solder Volumes[ J]. Sens Ac- tuators, 2002, 99A: 194-197.
  • 10DARVEAUX R, REICHMAN C, BERRY C J, et al. Effect of Joint Size and Pad Metallization on Solder Mechanical Properties [ J ]. Electronic Components & Technology Conference, ECTC 58th, IEEE 2008: 113- 122.

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