摘要
本文采用世界卫生组织推荐的神经行为核心测试组合，对３８名接触低场强微波者和３８名对照的行为功能进行了测试。结果表明，接触组的简单反应时、数字跨度、数字译码和目标追踪Ⅱ的标准分以及情感状态特征的愤怒—敌意得分明显低于对照组，接触组与对照组行为测试总分差异有显著性，接触微波工龄与行为测试总分存在负相关，结果提示长期接触低场强微波可引起神经行为功能发生改变。
Thirty-eight workers exposed to low power microwave(1 5-7 5μw/cm) and 38 workers to be used as control were examined by WHO recommend Neurobehavioral Croe Test Battery.The result indicated that workers exposed to low power microwave were siginificantly lower than the control group in the scores of Digit Span.Digit Symbol Test and Pursuit Aiming Test Ⅱ and angry scores of mood state( P <0 05 or P <0 01).The Simple Visual Reaction Time was slower than the control( P <0 01).The total scores from above two groups were sinificantly different( P <0 05).The total scores of workers exposed to microwave were negative correlated with their years of exposure( r=-0 414,P< 0 01).The result suggested that low power microwave exposure for long-term could result in neurobehavioral function change.
出处
《现代预防医学》
CAS
1997年第1期34-36,共3页
Modern Preventive Medicine
关键词
低场强微波
神经行为功能
Low power microwave Neurobehavioral function
