摘要
对寿命服从Weibull分布的某型晶闸管恒定应力加速寿命试验中的零失效数据,运用经典的统计方法和Bayes方法进行了处理,分别给出了在正常应力下失效概率的极大似然估计和多层Bayes估计,对2种估计结果与现场试验数据下所得估计结果的比较表明,Bayes估计的绝对误差为5.89×10-5,它小于极大似然估计的绝对误差2.438×10-3。随机模拟表明本文所给方法正确有效。
t Upon the condition of constant stress accelerated life testing, zero-failure data with the Weibull distribution of certain type transistor switch is studied. Firstly, the zero-data is processed by using Bayes and classical statistical methods. Bayes estimation （BE） and maximum likelilood estimation （MLE） of failure probability under normal stress are given . Meanwhile, MLE and BE results are also compared with current expriment results,whieh shows that the absolute error of BE is 5.89×10^- ,and it is less than the absolute error of MLE which is 2. 438 ×10^-3. Finally, random simulation shows the given method is right and feasible.
出处
《航天控制》
CSCD
北大核心
2007年第1期75-79,共5页
Aerospace Control
关键词
恒应力加速寿命试验
失效概率
极大似然方法
BAYES方法
Constant stress accelerated life test
Failure probability
Maximum likelihood method
Bayes method
