摘要
研究建立了电感耦合等离子体质谱 (ICP -MS)测定高纯金属钐中14种稀土及11种非稀土杂质的测定方法。考察了钐基体对杂质元素测定的各种干扰影响。对无干扰的杂质元素 ,采取了直接测量的方式 ;对有干扰的元素 (Nd、Eu、Dy、Ho、Er、Tm) ,采用标准加入法的方式进行测定。选择内标元素Sc和Cs,有效补偿了由于基体效应带来的测量偏差。方法的检出限为0.012～83μg/L,加标回收率为88.6 %～108.0 % ,测定精密度(RSD)为0.55%～2.53 % ,方法可满足99.9
A method for the determination of impurities in high purity samarium by ICP-MS was reported.The mass spectrometric interference and matrix interference caused by samarium had been studied in detail.Direct determination was used for the interference-free impurities,and the standard addition method was used for the interfered impurities.Scandium and Cesium,when used simultaneously as internal standards,could correct the Sm matrix interference efficiently.The detection limits were0.012～83μg/L,the recoveries for the standard addition method were88.6%～108.0%and the RSDs were0.55%～2.35%.The method is applicable for the determination of impurities in Sm samples with99.9%purity.
出处
《分析测试学报》
CAS
CSCD
北大核心
2005年第1期73-75,79,共4页
Journal of Instrumental Analysis
