摘要
用电感耦合等离子体质谱(ICP MS)直接测定超细锆钇粉中多种杂质元素,考察了基体效应对测定元素的影响。定量加入内标元素有效地校正了基体效应及仪器波动等因素引起的测量偏差。方法的固体检出限在0.01～10μg/g;精密度在1.1%～4.7%;加标回收率在91.0%～110.5%范围。
The determination of multi-impurities in superfine zirconium and yttrium oxide using the inductively coupled plasma mass spectrometric technique (ICP-MS) has been developed.The instrumental parameters and the effects caused by matrix have been studied.The influence of mass spectrometry interference has been corrected by selecting different isotopes.The addition of internal standard elements (Sc and Cs) corrected the effects of matrix efficiently. The detection limit was 0.01～10 μg/g, RSD was 1.1%～4.7% and the recovery was 91.0%～110.5%.
出处
《分析科学学报》
CAS
CSCD
2005年第1期87-89,共3页
Journal of Analytical Science
关键词
ICP-MS
超细锆钇粉
杂质元素
ICP-MS
Superfine zirconium and yttrium oxide
Trace impurities
