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2-μm single longitudinal mode GaSb-based laterally coupled distributed feedback laser with regrowth-free shallow-etched gratings by interference lithography 被引量:9
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作者 杨成奥 张宇 +6 位作者 廖永平 邢军亮 魏思航 张立春 徐应强 倪海桥 牛智川 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第2期181-185,共5页
We report a type-I Ga Sb-based laterally coupled distributed-feedback(LC-DFB) laser with shallow-etched gratings operating a continuous wave at room temperature without re-growth process. Second-order Bragg gratings... We report a type-I Ga Sb-based laterally coupled distributed-feedback(LC-DFB) laser with shallow-etched gratings operating a continuous wave at room temperature without re-growth process. Second-order Bragg gratings are fabricated alongside the ridge waveguide by interference lithography. Index-coupled LC-DFB laser with a cavity of 1500 μm achieves single longitudinal mode continuous-wave operation at 20℃ with side mode suppression ratio(SMSR) as high as 24 dB.The maximum single mode continuous-wave output power is about 10 mW at room temperature(uncoated facet). A low threshold current density of 230 A/cm^2 is achieved with differential quantum efficiency estimated to be 93 mW/A. The laser shows a good wavelength stability against drive current and working temperature. 展开更多
关键词 laterally coupled distributed feedback laser LC-DFB interference lithography GASB second-order Bragg grating
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The theoretic analysis of maskless surface plasmon resonant interference lithography by prism coupling 被引量:5
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作者 方亮 杜惊雷 +4 位作者 郭小伟 王景全 张志友 罗先刚 杜春雷 《Chinese Physics B》 SCIE EI CAS CSCD 2008年第7期2499-2503,共5页
The use of an attenuated total reflection-coupling mode of prism coated with metal film to excite the interference of the surface plasmon polaritons (SPPs) was proposed for periodic patterning with a resolution of s... The use of an attenuated total reflection-coupling mode of prism coated with metal film to excite the interference of the surface plasmon polaritons (SPPs) was proposed for periodic patterning with a resolution of subwavelength scale. High intensity of electric field can be obtained because of the coupling between SPPs and evanescence under a resonance condition, which can reduce exposure time and improve contrast. In this paper, several critical parameters for maskless surface plasmon resonant lithography are described, and the preliminary simulation based on a finite difference timedomain technique agrees well with the theoretical analysis, which demonstrates this scheme and provides the theoretical basis for further experiments. 展开更多
关键词 surface plasmon polaritons (SPPs) ENHANCEMENT interference lithography RESOLUTION
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Fabrication of 4-Inch Nano Patterned Wafer with High Uniformity by Laser Interference Lithography 被引量:3
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作者 Gen Yue Yu Lei +2 位作者 Jun-Hui Die Hai-Qiang Jia Hong Chen 《Chinese Physics Letters》 SCIE CAS CSCD 2018年第5期56-59,共4页
We report the fabrication of 4-inch nano patterned wafer by two-beam laser interference lithography and analyze the uniformity in detail. The profile of the dots array with a period of 800 nm divided into five regions... We report the fabrication of 4-inch nano patterned wafer by two-beam laser interference lithography and analyze the uniformity in detail. The profile of the dots array with a period of 800 nm divided into five regions is characterized by a scanning electron microscope. The average size in each region ranges from 270 nm to 320 nm,and the deviation is almost 4%, which is approaching the applicable value of 3% in the industrial process. We simulate the two-beam laser interference lithography system with MATLAB software and then calculate the distribution of light intensity around the 4 inch area. The experimental data fit very well with the calculated results. Analysis of the experimental data and calculated data indicates that laser beam quality and space filter play important roles in achieving a periodical nanoscale pattern with high uniformity and large area. There is the potential to obtain more practical applications. 展开更多
关键词 exp Fabrication of 4-Inch Nano Patterned Wafer with High Uniformity by Laser interference lithography
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Developments at SSRF in soft X-ray interference lithography 被引量:4
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作者 杨树敏 王连升 +5 位作者 赵俊 薛超凡 刘海岗 许子建 吴衍青 邰仁忠 《Nuclear Science and Techniques》 SCIE CAS CSCD 2015年第1期1-7,共7页
The soft X-ray interference lithography(XIL) branch beamline at Shanghai Synchrotron Radiation Facility(SSRF) is briefly introduced in this article. It is designed for obtaining 1D(line/space) and 2D(dot/hole)periodic... The soft X-ray interference lithography(XIL) branch beamline at Shanghai Synchrotron Radiation Facility(SSRF) is briefly introduced in this article. It is designed for obtaining 1D(line/space) and 2D(dot/hole)periodic nanostructures by using two or more coherent extreme ultraviolet(EUV) beams from an undulator source. A transmission-diffraction-grating type of interferometer is used at the end station. Initial results reveal high performance of the beamline, with 50 nm half-pitch 1D and 2D patterns from a single exposure area of400 μm× 400 μm. XIL is used in a growing number of areas, such as EUV resist test, surface enhanced Raman scattering(SERS) and color filter plasmonic devices. By using highly coherent EUV beam, broadband coherent diffractive imaging can be performed on the XIL beamline. Well reconstructed pinhole of φ20 μm has been realized. 展开更多
关键词 上海同步辐射装置 干涉光刻 软X射线 表面增强拉曼散射 光源 纳米结构 光束线 SSRF
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The recent development of soft x-ray interference lithography in SSRF 被引量:2
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作者 Jun Zhao Shumin Yang +6 位作者 Chaofan Xue Liansheng Wang Zhaofeng Liang Lei Zhang Yong Wang Yanqing Wu Renzhong Tai 《International Journal of Extreme Manufacturing》 2020年第1期101-107,共7页
This paper introduces the recent progress in methodologies and their related applications based on the soft x-ray interference lithography beamline in the Shanghai synchrotron radiation facility.Dual-beam,multibeam in... This paper introduces the recent progress in methodologies and their related applications based on the soft x-ray interference lithography beamline in the Shanghai synchrotron radiation facility.Dual-beam,multibeam interference lithography and Talbot lithography have been adopted as basic methods in the beamline.To improve the experimental performance,a precise real-time vibration evaluation system has been established;and the lithography stability has been greatly improved.In order to meet the demands for higher resolution and practical application,novel experimental methods have been developed,such as high-order diffraction interference exposure,high-aspect-ratio and large-area stitching exposure,and parallel direct writing achromatic Talbot lithography.As of now,a 25 nm half-pitch pattern has been obtained;and a cm2 exposure area has been achieved in practical samples.The above methods have been applied to extreme ultraviolet photoresist evaluation,photonic crystal and surface plasmonic effect research,and so on. 展开更多
关键词 soft x-ray EUV interference lithography
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Surface Plasmon Interference Lithography Assisted by a Fabry-Perot Cavity Composed of Subwavelength Metal Grating and Thin Metal Film 被引量:1
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作者 梁慧敏 王景全 +1 位作者 王学 王桂梅 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第10期51-54,共4页
A surface plasmon interference lithography assisted by a Fabry-Perot (F-P) cavity composed of subwavelength metal gratings and a thin metal fihn is proposed to fabricate high-quality nanopatterns. The calculated res... A surface plasmon interference lithography assisted by a Fabry-Perot (F-P) cavity composed of subwavelength metal gratings and a thin metal fihn is proposed to fabricate high-quality nanopatterns. The calculated results indicate that uniform straight interference fringes with high contrast and high electric-field intensity are formed in the resist under the F-P cavity. The analyses of spatial frequency spectra illuminate the physical mechanism of the formation for the interference fringes. The influence of the F-P cavity spacing is discussed in detail. Moreover, the error analyses reveal that all parameters except the metal grating period in this scheme can bear large tolerances for the device fabrication. 展开更多
关键词 Surface Plasmon interference lithography Assisted by a Fabry-Perot Cavity Composed of Subwavelength Metal Grating and Thin Metal Film
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Bragg-Angle Diffraction in Slant Gratings Fabricated by Single-Beam Interference Lithography
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作者 Xinping Zhang Shengfei Feng Tianrui Zhai 《Optics and Photonics Journal》 2012年第1期13-16,共4页
A single-beam interference-lithography scheme is demonstrated for the fabrication of large-area slant gratings, which requires exposure of the photoresist thin film spin-coated on a glass plate with polished side-wall... A single-beam interference-lithography scheme is demonstrated for the fabrication of large-area slant gratings, which requires exposure of the photoresist thin film spin-coated on a glass plate with polished side-walls to a single laser beam in the ultraviolet and requires small coherence length of the laser. No additional beam splitting scheme and no adjustments for laser-beam overlapping and for optical path-length balancing are needed. Bragg-angle diffractions are observed as strong optical extinction that is tunable with changing the angle of incidence. This device is important for the design of efficient filters, beam splitters, and photonic devices. 展开更多
关键词 Slant GRATING SINGLE-BEAM interference lithography Bragg-Angle DIFFRACTION
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Global alignment reference strategy for laser interference lithography pattern arrays
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作者 Xiang Gao Jingwen Li +1 位作者 Zijian Zhong Xinghui Li 《Microsystems & Nanoengineering》 2025年第2期277-287,共11页
Large-area gratings play a crucial role in various engineering fields.However,traditional interference lithography is limited by the size of optical component apertures,making large-area fabrication a challenging task... Large-area gratings play a crucial role in various engineering fields.However,traditional interference lithography is limited by the size of optical component apertures,making large-area fabrication a challenging task.Here,a method for fabricating laser interference lithography pattern arrays with a global alignment reference strategy is proposed.This approach enables alignment of each area of the laser interference lithography pattern arrays,including phase,period,and tilt angle.Two reference gratings are utilized:one is detached from the substrate,while the other remains fixed to it.To achieve global alignment,the exposure area is adjusted by alternating between moving the beam and the substrate.In our experiment,a 3×3 regions grating array was fabricated,and the−1st-order diffraction wavefront measured by the Fizeau interferometer exhibited good continuity.This technique enables effective and efficient alignment with high accuracy across any region in an interference lithography pattern array on large substrates.It can also serve as a common technique for fabricating various types of periodic structures by rotating the substrate. 展开更多
关键词 reference gratings interference lithography global alignment reference strategy laser interference lithography pattern fabricating laser interference lithography pattern arrays reference grating optical component aperturesmaking laser interference lithography
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扫描干涉曝光系统中双频激光干涉测量误差建模与分析 被引量:1
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作者 王新宇 李文昊 +4 位作者 王玮 刘兆武 姜珊 周文渊 巴音贺希格 《中国光学(中英文)》 北大核心 2025年第2期224-236,共13页
扫描干涉场曝光技术(SBIL)是制作单体大面积高精度光栅的有效途径,采用双频激光干涉仪反馈工作台位置进行干涉条纹的精确拼接,会不可避免地引入光栅刻线误差,导致光栅衍射波前质量降低。针对工作台的位移测量误差,分析了激光干涉仪自身... 扫描干涉场曝光技术(SBIL)是制作单体大面积高精度光栅的有效途径,采用双频激光干涉仪反馈工作台位置进行干涉条纹的精确拼接,会不可避免地引入光栅刻线误差,导致光栅衍射波前质量降低。针对工作台的位移测量误差,分析了激光干涉仪自身结构因素引起的本征误差,提出了复杂环境下激光干涉仪本征误差的指标评价方法。建立了实际工况与经验公式相结合的死程误差和测量光程变化误差理论模型。通过构建平移和旋转算子,推导了工作台任意点旋转和平移之间的耦合关系,模拟了不同工作台姿态滚转角下的测量误差。进行了位移误差实验和光栅扫描曝光实验。实验结果表明,位移误差与理论计算结果一致,制作200 mm×200 mm光栅的衍射波前为0.278λ@632.8 nm。本文分析方法贯通了光栅衍射波前与测量误差的传递链路,为制作米级尺寸纳米精度全息光栅奠定了理论和实验基础。 展开更多
关键词 扫描干涉场曝光系统 衍射波前 工作台位移测量 双频激光干涉仪 误差分析
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软X射线变线距闪耀光栅研制(特邀) 被引量:1
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作者 耿青霖 付硕 +4 位作者 陈智文 刘毅 刘正坤 邱克强 洪义麟 《光学学报(网络版)》 2025年第19期18-24,共7页
国家同步辐射实验室新建软X射线共振散射束线的能量范围覆盖240~700 eV,其光栅单色器需要使用一块中心线密度为900 line/mm的变线距闪耀光栅。采用球面波与非球面波干涉的全息曝光光路,通过线密度的高精度测量结果指导曝光光路调节,实... 国家同步辐射实验室新建软X射线共振散射束线的能量范围覆盖240~700 eV,其光栅单色器需要使用一块中心线密度为900 line/mm的变线距闪耀光栅。采用球面波与非球面波干涉的全息曝光光路,通过线密度的高精度测量结果指导曝光光路调节,实现对光栅线密度系数的修正。最终成功在硅基底上制作出有效面积为90 mm×20 mm的变线距闪耀光栅,线密度残差均方根(RMS)值为0.0127 line/mm,优于光栅需求指标0.0225 line/mm。该光栅已成功应用于软X射线共振散射线,当出射狭缝为55μm时,分辨本领达到1590@244.4 eV。 展开更多
关键词 闪耀光栅 全息光刻 非球面波干涉曝光 软X射线共振散射
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Laser Interference Lithography for Fabrication of Planar Scale Gratings for Optical Metrology 被引量:9
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作者 Yuki Shimizu 《Nanomanufacturing and Metrology》 2021年第1期3-27,共25页
Laser interference lithography is an attractive method for the fabrication of a large-area two-dimensional planar scale grating,which can be employed as a scale for multi-axis optical encoders or a diffractive optical... Laser interference lithography is an attractive method for the fabrication of a large-area two-dimensional planar scale grating,which can be employed as a scale for multi-axis optical encoders or a diffractive optical element in many types of optical sensors.Especially,optical configurations such as Lloyd's mirror interferometer based on the division of wavefront method can generate interference fringe fields for the patterning of grating pattern structures at a single exposure in a stable manner.For the fabrication of a two-dimensional scale grating to be used in a planar/surface encoder,an orthogonal two-axis Lloyd's mirror interferometer,which has been realized through innovation to Lloyd’s mirror interferometer,has been developed.In addition,the concept of the patterning of the two-dimensional orthogonal pattern structure at a single exposure has been extended to the non-orthogonal two-axis Lloyd’s mirror interferometer.Furthermore,the optical setup for the non-orthogonal two-axis Lloyd's mirror interferometer has been optimized for the fabrication of a large-area scale grating.In this review article,principles of generating interference fringe fields for the fabrication of a scale grating based on the interference lithography are reviewed,while focusing on the fabrication of a two-dimensional scale grating for planar/surface encoders.Verification of the pitch of the fabricated pattern structures,whose accuracy strongly affects the performance of planar/surface encoders,is also an important task to be addressed.In this paper,major methods for the evaluation of a grating pitch are also reviewed. 展开更多
关键词 Planar scale grating interference lithography Lloyd’s mirror interferometer interference fringe
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反射式全息光刻系统的对比度分析
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作者 赵家琦 胡飞 +2 位作者 郭登极 张贤鹏 王序进 《激光技术》 北大核心 2025年第4期532-538,共7页
全息光刻作为一种高效率的微纳加工方法,在3维微纳结构制造领域引起了广泛的研究兴趣。为了分析3维微纳结构的形貌演变并研究曝光系统设计对所制备结构的影响,基于全息光刻原理,建立了光刻胶内的3维曝光剂量模型,并进一步建立了3维微纳... 全息光刻作为一种高效率的微纳加工方法,在3维微纳结构制造领域引起了广泛的研究兴趣。为了分析3维微纳结构的形貌演变并研究曝光系统设计对所制备结构的影响,基于全息光刻原理,建立了光刻胶内的3维曝光剂量模型,并进一步建立了3维微纳结构的形貌演化模型;基于上述数值模型进行了理论分析,探索了光源偏振、曝光基底反射、入射光相位漂移等关键因素对曝光场对比度的影响。结果表明,在经典反射式全息光刻系统中,横向电波-横向电波(TETE)偏振入射光在不同入射角下表现出高对比度(0.95以上),明显优于其它偏振组合;曝光基底反射率对基底法线方向对比度具有重要影响并且二者正相关;大幅值低频相位漂移的入射光将导致曝光场对比度明显下降,因此曝光系统应主动控制环境和系统自身扰动,以获得高对比度的曝光场。该研究为反射式全息光刻系统的参数优化设计提供了参考。 展开更多
关键词 光学制造 全息光刻 光束干涉 微纳结构 对比度
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Piecewise Linear Weighted Iterative Algorithm for Beam Alignment in Scanning Beam Interference Lithography
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作者 Ying SONG Bayanheshig +2 位作者 Shuo LI Shan JIANG Wei WANG 《Photonic Sensors》 SCIE EI CSCD 2019年第4期344-355,共12页
To obtain a good interference fringe contrast and high fidelity,an automated beam iterative alignment is achieved in scanning beam interference lithography(SBIL).To solve the problem of alignment failure caused by a l... To obtain a good interference fringe contrast and high fidelity,an automated beam iterative alignment is achieved in scanning beam interference lithography(SBIL).To solve the problem of alignment failure caused by a large beam angle(or position)overshoot exceeding the detector range while also speeding up the convergence,a weighted iterative algorithm using a weight parameter that is changed linearly piecewise is proposed.The changes in the beam angle and position deviation during the alignment process based on different iterative algorithms are compared by experiment and simulation.The results show that the proposed iterative algorithm can be used to suppress the beam angle(or position)overshoot,avoiding alignment failure caused by over-ranging.In addition,the convergence speed can be effectively increased.The algorithm proposed can optimize the beam alignment process in SBIL. 展开更多
关键词 Piecewise linear weighted iterative algorithm beam alignment scanning beam interference lithography(SBIL) overshoot suppression convergence speed
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Flexible Evanescent Wave Interference Lithography System for Sub-half-Wavelength Complex Relief Structures Fabrication
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作者 Yuki Torii Shuzo Masui +4 位作者 Yuki Matsumoto Kunikazu Suzuki Masaki Michihata Kiyoshi Takamasu Satoru Takahashi 《Nanomanufacturing and Metrology》 2021年第4期256-270,共15页
Surface microstructures impart various useful properties to objects,for example,improving optical characteristics,wettability,and sliding properties.It is well known that biomimicking relief structures are effective i... Surface microstructures impart various useful properties to objects,for example,improving optical characteristics,wettability,and sliding properties.It is well known that biomimicking relief structures are effective in making such properties arise and have been studied to be applied to various devices.Furthermore,they are expected to be utilized not only for improving a particular property but also for adding more complex functions on a device's urface by fabricating different multi-functional structures on a single surface in the future.However,to begin with,artificially fabricating such biomimicking special functional relief is difficult.One typical feature of biomimicking surfaces is the dual-scale structure,the smaller one of which is less than 200 nm.Moreover,in the case of realizing the more complex devices,it is necessary to fabricate various forms as changing process conditions dynamically.In this study,we proposed and developed a flexible evanescent wave interference lithography system as a novel fabrication method,which allows us to realize the fabrication of sub-half-wavelength complex relief structures.Firstly,we theoretically analyzed the fundamental behavior of the fabricated structure and found that the proposed concept has the potential to realize one of the target complex structures.Secondly,we developed the proposed system with high process flexibility,in which the number of beams,the azimuth angles,and the polarization can be simply manipulated.Finally,we validated the concept of the designed system by some experiments,where we fabricated dual-scale structures with 840-nm and 190-nm fringe patterns simultaneously. 展开更多
关键词 Evanescent wave Biomimetics interference lithography Micro fabrication Surface structure
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四激光束干涉光刻制造纳米级孔阵的理论分析 被引量:13
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作者 张锦 冯伯儒 郭永康 《光子学报》 EI CAS CSCD 北大核心 2003年第4期398-401,共4页
为提供一个在大范围内曝光出深亚微米甚至纳米级周期性密集图形的廉价的方法 ,研究了四激光束干涉光刻的原理 ,分析了干涉曝光的结果 ,并进行了计算机模拟 用现有的光源 ,如4 4 2nm、365nm、2 4 8nm、193nm激光 ,曝光得到的图形的临界... 为提供一个在大范围内曝光出深亚微米甚至纳米级周期性密集图形的廉价的方法 ,研究了四激光束干涉光刻的原理 ,分析了干涉曝光的结果 ,并进行了计算机模拟 用现有的光源 ,如4 4 2nm、365nm、2 4 8nm、193nm激光 ,曝光得到的图形的临界尺寸容易做到 180~ 70nm 具有实际上无限制的焦深和容易实现的大视场 适合硅基CCDs。 展开更多
关键词 纳米级孔阵 四激光束干涉光刻 微细加工光学技术 干涉曝光 计算机模拟 半导体制造业
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超精密外差利特罗式光栅干涉仪位移测量系统 被引量:19
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作者 王磊杰 张鸣 +2 位作者 朱煜 鲁森 杨开明 《光学精密工程》 EI CAS CSCD 北大核心 2017年第12期2975-2985,共11页
开展了扫描干涉光刻机工作台超精密位移测量的实验研究,以提高扫描干涉光刻机的环境鲁棒性。针对扫描干涉光刻机工作台位移测量精度,提出了新型高环境鲁棒性外差利特罗式光栅干涉仪测量系统。介绍了系统测量原理,设计了测量系统,提出了... 开展了扫描干涉光刻机工作台超精密位移测量的实验研究,以提高扫描干涉光刻机的环境鲁棒性。针对扫描干涉光刻机工作台位移测量精度,提出了新型高环境鲁棒性外差利特罗式光栅干涉仪测量系统。介绍了系统测量原理,设计了测量系统,提出了基于Elden公式的系统死程误差建模方法。设计制造了尺寸仅为48mm×48mm×18mm的光栅干涉仪。基于误差模型计算了死程误差,计算结果表明:对于1.52mm死程的光栅干涉仪,宽松的环境波动指标(温度波动为0.01℃、压力梯度为±7.5Pa、相对湿度波动为1.5%、CO2含量波动为±50×10-6)仅引起±0.05nm的死程误差。最后,设计了基于商用双频激光平面镜干涉仪的测量比对系统,开展了光栅干涉仪原理验证实验和测并量稳定性实验。原理验证实验表明:光栅干涉仪原理正确且系统分辨率达0.41nm。测量稳定性实验表明:常规实验室环境下,环境波动引起的死程误差为7.59nm(3σ)@<0.9Hz&1~10Hz,优于同等环境条件下平面镜干涉仪的31.11nm(3σ)@<0.9Hz&1~10Hz。实验结果显示系统具有很高的环境鲁棒性。 展开更多
关键词 扫描干涉光刻 位移测量 光栅干涉仪 外差干涉仪 环境鲁棒性
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激光干涉光刻法制作100nm掩模 被引量:8
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作者 陈欣 赵青 +2 位作者 方亮 王长涛 罗先刚 《强激光与粒子束》 EI CAS CSCD 北大核心 2011年第3期806-810,共5页
介绍了一种利用激光干涉光刻技术得到特征图形,并通过离子束刻蚀将图形转移到铬层上,从而获得掩模的方法。针对掩模透光率以及对干涉图形对比度可能产生影响的两个参数分别进行了数值仿真,从而证明此方法的可行性和参数的优化选择。自... 介绍了一种利用激光干涉光刻技术得到特征图形,并通过离子束刻蚀将图形转移到铬层上,从而获得掩模的方法。针对掩模透光率以及对干涉图形对比度可能产生影响的两个参数分别进行了数值仿真,从而证明此方法的可行性和参数的优化选择。自搭干涉光刻实验系统,用257 nm的激光光源实现光刻,得到特征尺寸为100 nm的图形,再经过离子束刻蚀,最终得到周期200 nm、线宽100 nm的掩模。 展开更多
关键词 激光干涉光刻 离子束刻蚀 纳米光刻 微纳结构制造
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多光束激光干涉光刻图样 被引量:5
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作者 张伟 刘维萍 +2 位作者 顾小勇 谈春雷 彭长四 《强激光与粒子束》 EI CAS CSCD 北大核心 2011年第12期3157-3162,共6页
利用电磁理论,研究了多光束激光干涉图样的产生原理,结合计算机数值模拟和相关实验结果,分析了干涉图样的影响因素。研究结果表明:多光束激光干涉图样可以看成是多组余弦分布的平行线条纹的叠加;相干光束的偏振方向、入射方向、光束间... 利用电磁理论,研究了多光束激光干涉图样的产生原理,结合计算机数值模拟和相关实验结果,分析了干涉图样的影响因素。研究结果表明:多光束激光干涉图样可以看成是多组余弦分布的平行线条纹的叠加;相干光束的偏振方向、入射方向、光束间相位差是干涉图样的重要影响因素,改变这些因素,余弦分布的平行线条纹的振幅、位置、周期和方向发生变化,图样也随之变化。 展开更多
关键词 微纳结构 纳米制造 激光干涉光刻 激光干涉图样
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自溯源光栅标准物质及其应用 被引量:8
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作者 邓晓 李同保 程鑫彬 《光学精密工程》 EI CAS CSCD 北大核心 2022年第21期2608-2625,共18页
纳米计量技术是纳米尺度上的精密测量技术,是先进纳米制造技术的基础。其中,溯源性是纳米计量的基础问题,而研制纳米计量标准物质是实现纳米测量溯源性传递、保证纳米几何量值测试的统一性和准确性的关键环节。为适应纳米计量扁平化量... 纳米计量技术是纳米尺度上的精密测量技术,是先进纳米制造技术的基础。其中,溯源性是纳米计量的基础问题,而研制纳米计量标准物质是实现纳米测量溯源性传递、保证纳米几何量值测试的统一性和准确性的关键环节。为适应纳米计量扁平化量值传递溯源的要求,基于铬跃迁频率,采用原子光刻技术和软X射线干涉技术制备了1D 212.8 nm,2D 212.8 nm,1D 106.4 nm 3种自溯源光栅标准物质;在多层膜沉积技术研制硅纳米线宽结构的基础上,探索了基于硅晶格常数的硅纳米线宽自溯源型测量方法。在应用领域,开展了自溯源光栅对扫描探针显微镜、扫描电子显微镜等高精密测量仪器的校准研究。研究结果表明,自溯源型标准物质及其测量方法缩短了精密仪器和加工技术过程中的纳米长度计量溯源链,是先进纳米制造和新一代信息技术的有力支撑。 展开更多
关键词 纳米科技 纳米计量 自溯源标准物质 原子光刻技术 软X射线干涉光刻技术 多层膜沉积技术
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