摘要
We have shown in our first articles [1] [2] that even after encapsulation, the first rapid phase of degradation mechanism observed has been attributed to oxidation of interfaces and an alteration of the charges collection process. A second phase slower is induced by the oxidation of the active film, namely a decrease in the absorption and a degradation of the charge transport process. We revealed that another decrease in power conversion efficiency which has been induced by a possible interfacial passivation occurred at the organic/cathode interface, owing to the presence of residual oxygen, moisture and other impurities. This is in reality the real cause of the first rapid phase of degradation mechanism observed.
We have shown in our first articles [1] [2] that even after encapsulation, the first rapid phase of degradation mechanism observed has been attributed to oxidation of interfaces and an alteration of the charges collection process. A second phase slower is induced by the oxidation of the active film, namely a decrease in the absorption and a degradation of the charge transport process. We revealed that another decrease in power conversion efficiency which has been induced by a possible interfacial passivation occurred at the organic/cathode interface, owing to the presence of residual oxygen, moisture and other impurities. This is in reality the real cause of the first rapid phase of degradation mechanism observed.
