摘要
介绍X射线底片在超紫外波段(19.0～22.0nm)的相对标定方法。在LF-11激光装置上,用激光产生等离子体作为标定源,同时控制显影条件和底片类型与测X光激光时相同,标定出美国Kodak公司生产的SWR型底片特性曲线。解决了底片响应对所测X光激光增益系数的影响。结果表明,在超紫外波段,波长对特性曲线影响可不考虑。
A method of a relative calibration of SWR film used for mearuring intensity of X rays from laser produced plasma was reported in this paper. Using X rays from the plasma as a source of calibration, we have measured characteristics of Kodak SWR film produced by U.S.A. The result was used to modify the gain coefficiet of X-ray laser measured in our laboratory.
出处
《强激光与粒子束》
EI
CAS
CSCD
1992年第3期473-476,共4页
High Power Laser and Particle Beams
关键词
标定
X射线
底井
超紫外波段
characteristic curve, film, calibration.
